2022
DOI: 10.1007/s10854-022-09167-9
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Band gap tailoring and photosensitivity study of Al-doped SnO2 nanocrystallites prepared by sol–gel technique

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Cited by 2 publications
(1 citation statement)
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“…Powder X-ray diffraction (PXRD) of the nanomaterials was conducted using a Rigaku diffractometer (40 kV and 40 mA) equipped with Cu Kα radiation (λ = 1.54 Å) at a scanning rate 4°/min and within a 2θ range of 10–110°. The average crystallite sizes ( D ) of Pd, Ag, and Pd x Ag y in Pd 100 /FA, Pd 87.5 Ag 12.5 /FA, Pd 75 Ag 25 /FA, Pd 50 Ag 50 /FA, Pd 25 Ag 75 /FA, Pd 12.5 Ag 87.5 /FA, and Ag 100 /FA were evaluated using the Debye–Scherrer equation D = K λ/(β cos θ), where K is the Scherrer constant (0.89), λ is the X-ray wavelength (0.154 nm), β is the full-width at half-maxima of the diffraction peak, and θ is the diffraction angle. Advanced PHI-5000 Versa-probe setup was used to perform an X-ray photoelectron spectroscopic (XPS) study. The binding energies were referenced to the adventitious C 1s peak at 284.8 eV .…”
Section: Methodsmentioning
confidence: 99%
“…Powder X-ray diffraction (PXRD) of the nanomaterials was conducted using a Rigaku diffractometer (40 kV and 40 mA) equipped with Cu Kα radiation (λ = 1.54 Å) at a scanning rate 4°/min and within a 2θ range of 10–110°. The average crystallite sizes ( D ) of Pd, Ag, and Pd x Ag y in Pd 100 /FA, Pd 87.5 Ag 12.5 /FA, Pd 75 Ag 25 /FA, Pd 50 Ag 50 /FA, Pd 25 Ag 75 /FA, Pd 12.5 Ag 87.5 /FA, and Ag 100 /FA were evaluated using the Debye–Scherrer equation D = K λ/(β cos θ), where K is the Scherrer constant (0.89), λ is the X-ray wavelength (0.154 nm), β is the full-width at half-maxima of the diffraction peak, and θ is the diffraction angle. Advanced PHI-5000 Versa-probe setup was used to perform an X-ray photoelectron spectroscopic (XPS) study. The binding energies were referenced to the adventitious C 1s peak at 284.8 eV .…”
Section: Methodsmentioning
confidence: 99%