1997
DOI: 10.1063/1.364440
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Band gap modification in Ne+-ion implanted In1−xGaxAs/InP and InAsyP1−y/InP quantum well structures

Abstract: Band gap modification in Ne+-ion implanted In1−xGaxAs/InP (x=0.25, 0.33, 0.40, 0.47, 0.54, 0.61, 0.69) and InAsyP1−y/InP (y=0.32) quantum well structures has been studied by low temperature (12 K) photoluminescence spectra. The maximum usable high temperature anneal for inducing the compositional intermixing using an InP proximity cap is found to be ∼700 °C for 13 s. A second low-temperature (300 °C) anneal, following the high-temperature (700 °C) anneal, is found to induce greater band gap changes than the si… Show more

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Cited by 23 publications
(7 citation statements)
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“…Thus, one main reason for non-lasing at room temperature was the insufficient degree of quantum well intermixing: for room temperature operation, our AkT rule of thumb would imply that more than 100 annealing in the InGaAs/InP materials system has previously been shown experi mentally to allow bandgap shifts as large as 200 meV. 68 The intermixing of thinner wells and thick, high-bandgap barriers would enable the needed amount of carrier confinement.…”
Section: Ion Implanted Lateral Injection Lasersmentioning
confidence: 95%
“…Thus, one main reason for non-lasing at room temperature was the insufficient degree of quantum well intermixing: for room temperature operation, our AkT rule of thumb would imply that more than 100 annealing in the InGaAs/InP materials system has previously been shown experi mentally to allow bandgap shifts as large as 200 meV. 68 The intermixing of thinner wells and thick, high-bandgap barriers would enable the needed amount of carrier confinement.…”
Section: Ion Implanted Lateral Injection Lasersmentioning
confidence: 95%
“…Band gap modification in Netion implanted InGaAs/InP (for various Ga concentrations) and InAsP/InP (for 32% As) quantum well structures has been studied by low temperature PL spectra [27]. The maximum usable high temperature anneal for inducing the intermixing using an InP proximity cap is found to be -700 degrees C for 13 s. A second low-temperature (300 degrees C) anneal, following the high-temperature (700 degrees C) anneal, is found to induce greater band gap changes than the simple one-step anneal at 700 degrees C. The changes are found to be approximately proportional to the difference of bandgap energy between the well and the barrier materials; the proportionality coefficient increases with ion dose and reaches a maximum at a dose of -2 x 1 O' cm2.…”
Section: Band Engineeeiungmentioning
confidence: 99%
“…Ion implantation and annealing in the InGaAs/InP materials system has previously been shown experimentally to allow bandgap shifts as large as 200 meV. 68 The intermixing of thinner wells and thick, high-bandgap barriers would enable the needed amount of carrier confinement. We compare in Fig.…”
Section: Ion Implanted Lateral Injection Lasersmentioning
confidence: 99%