Rapid thermal annealing effects on step-graded InAlAs buffer layer and In 0.52 Al 0.48 As/In 0.53 Ga 0.47 As metamorphic high electron mobility transistor structures on GaAs substrates Exciton dissociation effects on time resolved photoluminescence measurements of an Al 0.53 In 0.47 P/Ga 0.52 In 0.48 P/Al 0.53 In 0.47 P -quantum well structure J. Appl. Phys. 89, 6426 (2001); 10.1063/1.1366661 Super-flat interfaces in pseudomorphic In 0.72 Ga 0.28 As/In 0.52 Al 0.48 As quantum wells grown on (411)A InP substrates by molecular beam epitaxy Investigation of optical properties of interfaces between heavily doped Al 0.48 In 0.52 As:Si and InP (Fe) substrates by photoreflectance analysisProperties of the interface between the epitaxial layer of heavily doped Al 0.48 In 0.52 As:Si and the InP͑Fe͒ substrate are investigated by photoluminescence in AlInAs:Si/InP͑Fe͒ heteroestructures grown by molecular beam epitaxy. The effect on heterostructure optical properties of including a thin Al 0.22 Ga 0.26 In 0.52 As:Si layer at the interface is investigated as well. To explain the different interface emission energies observed, the results are analyzed by using the mixed-type I-II interface model, which considers in the type II interface a narrow InAs well, with variable width, between AlInAs and InP. The observation of the interface emission at energies as high as 1.36 eV, at low excitation intensity, is explained taking into account the high doping level of the samples. The observed interface transition luminescence thermal quenching is tentatively explained by analyzing the spatial distribution of electrons in the triangular quantum well formed at the type II interface ͑or at the mixed I-II interface͒ as a function of the temperature.