2023
DOI: 10.1002/solr.202300073
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Band Bending at CdTe Solar Cell Contacts: Correlating Electro‐Optical and X‐Ray Photoelectron Spectroscopy Analyses of Thin Film Solar Cells

Abstract: With the semiconductor bulk properties reaching target values for highly efficient solar cells, efforts are applied to reduce losses at solar cell interfaces and contacts. Advances in understanding back contacts in thin‐film polycrystalline CdTe solar cells, a leading thin‐film PV technology, are reported. By using X‐Ray photoelectron spectroscopy, Kelvin probe spectroscopy, time‐ and energy‐resolved photoluminescence, defects at the back contact are analyzed. Densities of recombination centers and charged def… Show more

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Cited by 6 publications
(17 citation statements)
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“…Dopants can also increase non-radiative bulk recombination (e.g., Cu in high voltage CdTe solar cells, [81,42] comparison of Cu and As doping by Onno et al, [25] and comparison of As-doped devices 4 and 5 in this study), therefore reducing bulk recombination continues to be important. Back contact recombination, interface charges, band alignments, [27] and contact selectivity [25] will likely increase in importance for absorbers with reduced electronic disorder.…”
Section: Discussionmentioning
confidence: 99%
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“…Dopants can also increase non-radiative bulk recombination (e.g., Cu in high voltage CdTe solar cells, [81,42] comparison of Cu and As doping by Onno et al, [25] and comparison of As-doped devices 4 and 5 in this study), therefore reducing bulk recombination continues to be important. Back contact recombination, interface charges, band alignments, [27] and contact selectivity [25] will likely increase in importance for absorbers with reduced electronic disorder.…”
Section: Discussionmentioning
confidence: 99%
“…Fabrication and Characterization of As-doped Solar Cells 4: The Cd-SeTe/CdTe bilayer device stack was fabricated by vapor transport deposition (VTD) with in situ As doping followed by ZnTe and metal back contact. [17,4,19,25,27] Carrier density determined with capacitance-voltage (CV) was p = 2 × 10 16 cm −3 . JV and EQE characteristics were given in Ref.…”
Section: Methodsmentioning
confidence: 99%
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