Backside Charging Of The CCD

Janesick, James R.; Elliott, Tom; Daud, T.; McCarthy, J.A.; Blouke, Morley M.

doi:10.1117/12.950308

Cited by 34 publications

(30 citation statements)

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“…The spectral line at 630 nm is indicative of dissociative recombination involving O 2 molecules and electrons near 300 km altitude (Mukherjee and Dyson, 1992). The superiority of charge coupled device (CCD) over almost all other image forming devices has been well established in the last two decades due to it's high resolution, high quantum efficiency, broad spectral response, low noise and large dynamic range (Janesick and Blouke, 1987;Abreu and Skinner, 1989). Figure 2 shows the location of the observing station Kolhapur with respect to geographic coordinates.…”

Section: All-sky Cameramentioning

confidence: 99%

First results of all-sky imaging from India

et al. 2014

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Section: All-sky Cameramentioning

confidence: 99%

First results of all-sky imaging from India

et al. 2014

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“…Previous back-illumination techniques for conventional scientific CCD's include UV flooding [24] and laser annealing of an ion implanted backside layer [13], [25]. In both cases a built-in field is generated to overcome the native depletion layer at the backside surface for p-type silicon due to positive fixed oxide charge at the silicon-SiO 2 interface [1].…”

Section: Ccd Fabrication and Back-illumination Technologymentioning

confidence: 99%

Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon

Holland

Groom

Palaio

et al. 2003

IEEE Trans. Electron Devices

258

244

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Abstract-Charge-coupled devices (CCD's) have been fabricated on high-resistivity, n-type silicon. The resistivity, on the order of 10,000 Ω-cm, allows for depletion depths of several hundred microns. Fully-depleted, back-illuminated operation is achieved by the application of a bias voltage to a ohmic contact on the wafer back side consisting of a thin in-situ doped polycrystalline silicon layer capped by indium tin oxide and silicon dioxide. This thin contact allows for good short wavelength response, while the relatively large depleted thickness results in good near-infrared response.

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“…We have used a cooled CCD to generate fluorescence images with the TSM (Wright et al, 1989). The cooled CCD is a n excellent imaging device and has several advantages including the ability to detect weakly fluorescent specimens with high resolution (Hiraoka et al, 1987;Janesick and Blouke, 1987;Wright et al, 1990).…”

Section: Tandem Scanning Confocal Microscopementioning

confidence: 96%

Confocal fluorescence microscopy and three‐dimensional reconstruction

Wright

Schatten

1991

J. Elec. Microsc. Tech.

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Several recent technological advances have considerably improved the field of confocal fluorescence microscopy. Improvements in confocal microscope design, new fluorescent probes and indicators, more sensitive imaging devices, and computer advances which allow for data manipulation and storage provide a convenient method to acquire complex three-dimensional (3-D) architectural details which previously were difficult or impossible to obtain from biological specimens. Applications of the laser scanning and tandem scanning confocal microscopes offer the potential for gaining powerful insights into the complex relationship of cellular structure and function. Confocal microscopy generates optical sections free from out-of-focus blur. With the development of new visualization tools to render and display complex 3-D data, a set of optical sections taken at different focal planes can be three-dimensionally reconstructed to create an animated sequence which can reveal latent features of the specimen. The combination of confocal microscopy and 3-D reconstruction provides a powerful new imaging tool to advance knowledge about structural and functional cellular properties as they occur dynamically in three dimensions.

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Backside Charging Of The CCD

Cited by 34 publications

References 0 publications

First results of all-sky imaging from India

First results of all-sky imaging from India

Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon

Confocal fluorescence microscopy and three‐dimensional reconstruction

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