Backscattering of low-energy (0–8 eV) electrons by a silicon surface

Шпеник, О. Б.; Érdevdi, N. M.; Popik, T. Yu.

doi:10.1134/1.1258667

Cited by 6 publications

(2 citation statements)

References 3 publications

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“…Recent measurements by Shpenik et al [32] show that electron reflection at a surface increases steeply at the low particle energies of interest here, and the reflection coefficient is influenced by the properties of adsorbed gas layers. If these properties change, the attendant variation in electron reflection will alter the average number of transits an electron will make in the inter-electrode space before being absorbed by an electrode.…”

Section: Discussionmentioning

confidence: 72%

Anomalous energy distribution in electron beams

Hirsch¹

2001

J. Phys. D: Appl. Phys.

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Experiments show anomalous energy distributions in electron beams of low energy ({<}50 eV) with a short drift length of about 2 cm. These anomalous distributions are not due to the well known Boersch effect, but appear to be caused by electron interaction with space charge oscillations very close to the thermionically emitting surface. The dependence of the energy distribution on beam current and voltage is examined, and the connection of the space charge oscillations with previously reported anomalies in thermionic electron emission is discussed.

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Section: Discussionmentioning

confidence: 72%

Anomalous energy distribution in electron beams

Hirsch¹

2001

J. Phys. D: Appl. Phys.

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“…But as we have shown, there obviously are circumstances where such treatments may need to take reflection into account. Particularly if the impact energy is low, the reflection coefficient can be quite large [16]. Depending on the conditions of reflection, a returning electron can orbit through the cathode region a number of times, and in doing so, it can significantly contribute to the space charge density there.…”

Section: Summary and Discussionmentioning

confidence: 99%

Abnormal electron temperatures and electron reflection in the cylindrical thermionic diode

Hirsch¹

2002

J. Phys. D: Appl. Phys.

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Experiments show that abnormally high electron temperatures, previously reported in space charge limited diodes, are an artifact of the measuring technique employed. The true electron energy distribution is non-Maxwellian and broadened through electron interaction with space charge oscillations. This process is influenced by electron reflection from the anode surface. It is shown that even a small amount of atomic hydrogen, formed by dissociation of molecular hydrogen at the hot emitter, and adsorbed on the anode, can change the reflection of electrons, and thus significantly alter the electron space charge interaction.

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