Backscattering in electron-impact excitation of multiply charged ions

Guo, X. Q.; Bell, E W.; Thompson, J. S.; Dunn, G. H.; Bannister, M. E.; Phaneuf, R. A.; Smith, A. C. H.

doi:10.1063/1.43699

Search citation statements

Order By: Relevance

Paper Sections

Select...

Trochoidal Merging Of Beams: Electron-ion Excitation2

Inelastic Backscattering and The Semi-classical Approach1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1999

Publication Types

Select...

Article2

Relationship

Self Cite0

Independent2

Authors

Journals

Cited by 2 publications

(3 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Another novel approach was applied by the ORNL group in order to extract angular information from near-threshold inelastic scattering (Guo et al 1993). When the electron and ion beams are co-axial, as in the merged-beams scenario, the angular distribution of near-threshold inelastically scattered electrons in the laboratory frame of reference is particularly sensitive to the ion beam velocity.…”

Section: Inelastic Backscattering and The Semi-classical Approachmentioning

confidence: 99%

Electron-ion scattering

Williams

1999

Rep. Prog. Phys.

View full text Add to dashboard Cite

show abstract

Section: Inelastic Backscattering and The Semi-classical Approachmentioning

confidence: 99%

Electron-ion scattering

Williams

1999

Rep. Prog. Phys.

View full text Add to dashboard Cite

show abstract

“…Cross sections measured with MEIBEL show near-threshold resonances, and the data strongly indicate the interference of resonances in some cases. Backscattering of electrons in near-threshold excitation of ions by electron impact was emphatically demonstrated [79] and subsequently also rationalized in calculations.…”

Section: Trochoidal Merging Of Beams: Electron-ion Excitationmentioning

confidence: 92%

“…The MEIBEL technique has resulted in the measurement of total absolute excitation cross sections [12,[79][80][81][82][83][84][85][86] for a number of optically allowed transitions for both singly-and multiplycharged ions. More importantly, it has yielded cross sections for several intercombination transitions [81][82][83][84][85]87].…”

Section: Trochoidal Merging Of Beams: Electron-ion Excitationmentioning

confidence: 99%

Merged-beams experiments in atomic and molecular physics

et al. 1999

View full text Add to dashboard Cite

The merged-beams technique is powerful for the experimental study of certain classes of atomic and molecular processes that cannot be as readily or accurately addressed by other methods. The principal advantages of the technique are the ability to make quantitative studies of collisional interactions with high resolution at low relative energies, to collect products that have undergone appreciable angular scattering, and to investigate processes involving short-lived or chemically-reactive species. Despite continuing advances in ion-source and particle-beam technologies, merged-beams experiments remain a challenge, constituting a relatively small but growing fraction of the worldwide effort in atomic and molecular collisions research. This review outlines the fundamental principles of the merged-beams method, reviews techniques and progress, and focuses on three active programs to highlight the advantages of the method for addressing fundamental questions in atomic and molecular physics.

show abstract

Backscattering in electron-impact excitation of multiply charged ions

Cited by 2 publications

References 0 publications

Electron-ion scattering

Electron-ion scattering

Merged-beams experiments in atomic and molecular physics

Contact Info

Product

Resources

About