2022
DOI: 10.3390/nano12122065
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Back Interface Passivation for Efficient Low-Bandgap Perovskite Solar Cells and Photodetectors

Abstract: Low-bandgap (Eg~1.25 eV) mixed tin-lead (Sn-Pb) perovskites are promising candidates for efficient solar cells and self-powered photodetectors; however, they suffer from huge amounts of defects due to the unintentional p-type self-doping. In this work, the synergistic effects of maltol and phenyl-C61-butyric acid methyl ester (PCBM) were achieved to improve the performance of low-bandgap perovskite solar cells (PSCs) and unbiased perovskite photodetectors (PPDs) by passivating the defects and tuning charge tra… Show more

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Cited by 4 publications
(3 citation statements)
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“…The specific data was illustrated in Table S2. The device with AlN treatment had a larger R rec than the control device, which may be attributed to the reduced defects and improved charge transfer. , …”
Section: Resultsmentioning
confidence: 93%
See 1 more Smart Citation
“…The specific data was illustrated in Table S2. The device with AlN treatment had a larger R rec than the control device, which may be attributed to the reduced defects and improved charge transfer. , …”
Section: Resultsmentioning
confidence: 93%
“…The device with AlN treatment had a larger R rec than the control device, which may be attributed to the reduced defects and improved charge transfer. 29,30 Furthermore, the trap density (tDOS) was also investigated (Figure 4d). The device treated with AlN exhibited a lower trap density compared to the control device, which further confirms the effective passivation of defects.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…12 Developing chelating molecules that efficiently passivate and stabilize the fresh films, without inducing unfavorable carrier recombination, offers an effective way to improve the performance of mixed Sn−Pb perovskite electronics. 290 On the other hand, electrical shunts might be another serious issue for an efficient device considering that mixed Sn−Pb films present a high degree of roughness, especially when a thin ETL is deposited in the following via spin coating (Figure 7a-iii, iv). In order to reduce the layer roughness and improve the conformality of subsequently coated ETLs, an extra layer might be required.…”
Section: Exposed Surfacementioning
confidence: 99%