Back-end defect localization for 28nm FPGA

Ng, Jack Yi Jie; Ning, Liew Chiun; Ling, Khoo Khai

doi:10.1109/ipfa.2014.6898156

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2014

DOI: 10.1109/ipfa.2014.6898156

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Back-end defect localization for 28nm FPGA

Jack Yi Jie Ng

Liew Chiun Ning

Khoo Khai Ling

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Back-end defect localization for 28nm FPGA

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