“…Recently, a variety of microscopes such as confocal microscopy [16,17,18], wide field microscopy [19], structured illumination microscopy [20] and light sheet microscopy [21] benefited from using electrically or acoustically tunable lenses for axial scanning. However, as shown in [16] for confocal microscopy, the axial resolution degrades with increasing actuation voltages due to increasing aberrations of the tunable lens. In contrast, HiLo microscopy is expected to be robust against a degradation of the axial resolution due to aberrations, since the speckles that are used for the optical sectioning in the HiLo algorithm are invariant to aberrations and scattering in the sample (as long as the speckles are fully developed [10,11]).…”