Average depths of electron penetration: use as characteristic depths of exposure

Abstract

The detour factor as the measure of-electron scattering in a target was implemented in electron-beam dosimetry by Harder [3] by the definition as the ratio of a characteristic The average depth of electron penetration is introduced as depth, i.e., the extrapolated or projected range, to the CSDA the physical quantity useful in electron beam irradiation. It is defined as the average Of the maximum depths On the range. On the basis of Monte Carlo data on the projected range, detour factors have been calculated for a wide region of trajectories of electrons passing through finite, semi-infinite the initial energy of electrons and varieties of target material or iizfinite medium. The relation between the transmission coefficient as a function of slab thickness and the distribution ,41. The use of detour factor for scaling procedure in electronof the maximum depths is analyzed, and a semiempirical beam dosimetry has been studied recently ,51, equation to calculate the average depth of electron penetration is given for 0.1-to 50-MeV electrons incident on materials of atonlic numberS from 4 to 92, It is shown that the quantity introduced is usable as the characteristic depths of energy and charge depositions in a target, and can possibly be generalized to the case of heterogeneous targets.

Monte Carlo modelling of gamma-ray stopping efficiencies of Geiger–Müller counters

“…This, in turn, leads to the fact that the intrinsic gamma-ray detection efficiency of ZP1200 counters depends on the efficiency by which the incident photons are converted to secondary electrons in the solid parts of the detector as well as on the efficiency by which these secondary electrons penetrate the solid parts and reach the fill gas. As discussed in paper 1, the latter depends on the electron's projected range [50], emission position and direction.…”

Chemical Leaching of Inactive Cr and Subsequent Electrochemical Resurfacing of Catalytically Active Sites in Stainless Steel for High-Rate Alkaline Hydrogen Evolution Reaction

“…Similarly, Ni and Mn were also found to be retained with almost the same wt % values after chemical oxidation and electrochemical activation. This contradicting result is explained by the following facts. , In XPS, photoelectrons generated from the surface with a very low relative kinetic energy (∼1 keV) are detected and quantified and the photoelectrons that are generated from the elements buried under the surface layers (below ∼3 nm) are scattered within the material and go undetected. Hence, XPS serves as a highly sensitive surface analysis tool.…”

3D visualization of XFEL beam focusing properties using LiF crystal X-ray detector

“…As a result of multiple scattering, the trajectory of the electrons in LiF is rather wiggly than straight. Universal parametric formulas have been established, on the basis of Monte Carlo simulations of electron transport, supported by experimental data, for ‘average penetration depth’, ‘extrapolated range, ‘average reach’ and other related quantities for the electron energies higher than 100 keV (for example 44 45 46 ). Electrons with the energies lower than 100 keV have a range of the order of only a few micrometers in condensed materials and there is often little interest for the applications in such a small energies.…”