Automatic Temperature Analysis of an Image Sensor using an Application in a Semiconductor Industry

Wongsomboon, Chanathip; Maneerat, Noppadol; Thudthong, Jakkrit; Sukasem, Sutikamon; Yajima, Kuniaki; Pasaya, Bundit

doi:10.1109/iceast61342.2024.10553998

2024 10th International Conference on Engineering, Applied Sciences, and Technology (ICEAST) 2024

DOI: 10.1109/iceast61342.2024.10553998

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Automatic Temperature Analysis of an Image Sensor using an Application in a Semiconductor Industry

Chanathip Wongsomboon,

Noppadol Maneerat,

Jakkrit Thudthong

et al.

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Automatic Temperature Analysis of an Image Sensor using an Application in a Semiconductor Industry

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