2021
DOI: 10.1016/j.eswa.2021.114959
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Automatic mass spectra recognition for Ultra High Vacuum systems using multilabel classification

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Cited by 3 publications
(13 citation statements)
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“…The samples used for the comparative metrics have been obtained by synthetic generation, as described in a previous work [2]. Ideally, one should be able to use true residual gas samples obtained from RGA in UHV systems, but the availability of these is very limited, so this is an effective and reliable method for the controlled generation of a large number of samples.…”
Section: Synthetic Data Generation and Normalizationmentioning
confidence: 99%
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“…The samples used for the comparative metrics have been obtained by synthetic generation, as described in a previous work [2]. Ideally, one should be able to use true residual gas samples obtained from RGA in UHV systems, but the availability of these is very limited, so this is an effective and reliable method for the controlled generation of a large number of samples.…”
Section: Synthetic Data Generation and Normalizationmentioning
confidence: 99%
“…Such contaminants are deposited (mainly during the manufacturing process) on the inner surface of the vacuum chambers and hinder the pump-down process and, consequently, the generation of the required pressure. In particular, the presence of some contaminants may have effects on many other surface properties, such as the surface energy and secondary electron yield [1,2].…”
Section: Introductionmentioning
confidence: 99%
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