1975
DOI: 10.1107/s0021889875009417
|View full text |Cite
|
Sign up to set email alerts
|

Automatic collection of powder data from photographs

Abstract: A method is presented of determining powder data from photographs. With a microphotometer the density is measured in steps of 0.01 ° 20. These data are used by a computer program. With this program the background and the noise level are determined first. After the detection of the diffraction peaks, the peak positions and intensities are refined, a suitable model for the peak profile being used. A procedure is described for scaling of several photographs. The final results are illustrated with a comparison of … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
143
0

Year Published

1987
1987
2017
2017

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 239 publications
(143 citation statements)
references
References 5 publications
0
143
0
Order By: Relevance
“…On the assumption that it is appropriate to use the K = 0.9394, b of Fig. 3(b)] refined by smoothing, 30) sonnerveld method (background removal) 31) and Rachinger method (CuK ¡2 peaks removal), 32) and of 0.15406 nm (CuK ¡1 ), Fig. 6 indicates the detailed relationship among heat treatment temperature, D, grain size estimated from SEM images (Figs.…”
Section: Resultsmentioning
confidence: 99%
“…On the assumption that it is appropriate to use the K = 0.9394, b of Fig. 3(b)] refined by smoothing, 30) sonnerveld method (background removal) 31) and Rachinger method (CuK ¡2 peaks removal), 32) and of 0.15406 nm (CuK ¡1 ), Fig. 6 indicates the detailed relationship among heat treatment temperature, D, grain size estimated from SEM images (Figs.…”
Section: Resultsmentioning
confidence: 99%
“…15 At 300 °C and above, ½{310} superstructure reflections associated with in-phase tilting are observed at 36.5 °2θ, consistent with the tilted tetragonal structure with polar space group P4bm. 8 The intensities of the weak antiphase and in-phase superstructure reflections were carefully measured using an iterative method after Sonneveld & Visser 16 in PANalytical HighScore Plus 17 and normalised against the most intense reflection. Plotted as a function of temperature (Figure 2a), these show the same trends as the peak widths.…”
Section: Textmentioning
confidence: 99%
“…In the Rietveld method (Rietveld, 1969), the diffraction profile is calculated using the unit-cell dimensions to determine the peak positions, and the atomic positional and thermal displacement parameters as a model for the peak intensities. On the other hand, in the 'pattern-decomposition' technique, the step-scan data are decomposed into their component Bragg reflections without reference to the crystal structure (other than the unit-cell dimensions); that is, the calculated peak intensities are themselves variables in the fitting procedure (Sonneveld & Visser, 1975).…”
Section: Introductionmentioning
confidence: 99%