Automatic circuit for measuring the electrical conductivity of molten glass

Okhotin, M. V.; Raevskaya, E. I.; Tuzikov, A. I.; Tuznikov, A. I.

doi:10.1007/bf00673943

Cited by 1 publication

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“…One test was idled for 5 days and the other for 6 days, with conductivity measurements taken every 12 minutes. The results are shown in Figure 12; estimated spinel depth was calculated using Equation 5.…”

Section: Laboratory Glass Melt Testingmentioning

confidence: 99%

“…Because of the need to advance theoretical ideas on the formation of the structure of glass from melts and increased interest in the electric melting of glass, Okhotin et al developed an automatic measuring circuit and a cell suitable for laboratory and production measurements of conductivity. A short time later, Baucke and Frank introduced the absolute resistivity measurement of glass melts, which consisted of two parallel electrodes immersed in a melt with resistivity determined according to the Equation :

ρ = \frac{R A}{L}

…”

Section: Introductionmentioning

confidence: 99%

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Real‐time monitoring of crystal accumulation in the high‐level waste glass melters using an electrical conductivity method

Edwards

Matyáš

Crum

2017

Int J of Appl Glass Sci

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During the vitrification of high‐level radioactive waste (HLW) in HLW melters in the Waste Treatment and Immobilization Plant located in Washington State, spinel crystals [Fe, Ni, Mn, Zn]2+[Fe, Cr]23+normalO4 may precipitate from glass and accumulate in the melter riser, preventing the discharge of molten glass into canisters. Therefore, an effort is being made to develop an electrical conductivity method to monitor crystal buildup in the melter riser. A vertically configured electrical conductivity (EC) probe with an alumina shaft and Pt‐10%Rh‐electrodes was designed and tested in standard conductivity solutions and glass melts both with and without spinel crystals. The EC probe measured conductivity in conductivity solutions within 10% of their certified values and showed a linear relationship with increased spinel layer thicknesses. Testing in silicate glass containing spinel crystals allowed for the determination of spinel conductivity as a function of temperature. The conductivities of spinel crystals of 20‐24 S/m at 800°C were in excellent agreement with the conductivity of trevorite (NiFe2O4) crystals at 800°C reported in the literature. The conductivities of spinel crystals and measured changes in the conductivity across the accumulated layer allowed for a successful measurement of spinel crystal accumulation in simulated HLW glass.

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Section: Laboratory Glass Melt Testingmentioning

confidence: 99%