2012
DOI: 10.1109/tcpmt.2011.2182613
|View full text |Cite
|
Sign up to set email alerts
|

Automated Void Detection in Solder Balls in the Presence of Vias and Other Artifacts

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
29
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
4
1
1

Relationship

0
6

Authors

Journals

citations
Cited by 20 publications
(29 citation statements)
references
References 12 publications
0
29
0
Order By: Relevance
“…We claim that the new ideas mentioned in 2) and 3) are different to previous existing methods (2)(3)(4)(5) .…”
Section: Introductionmentioning
confidence: 79%
See 4 more Smart Citations
“…We claim that the new ideas mentioned in 2) and 3) are different to previous existing methods (2)(3)(4)(5) .…”
Section: Introductionmentioning
confidence: 79%
“…In typical 2D X-ray images (gray scale image, 0-255 levels), the solder balls are often interfered by other board components (2)(3) , for example some joints normally create some occluded solder balls. Then, the robust segmentation algorithms that are able to deal with different kinds of interfering backgrounds are essentially preferred.…”
Section: Individual Solder Ball Segmentation From the Background Of Imentioning
confidence: 99%
See 3 more Smart Citations