2021
DOI: 10.1109/ted.2021.3105089
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Automated Testing Algorithm for the Improvement of 1T1R ReRAM Endurance

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Cited by 2 publications
(2 citation statements)
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“…Adaptive write methods, multi-level sensing as well as complementary logic operations in the periphery and parallelization, are some issues to be taken into consideration in the design of the memory read/write drivers, which can require asynchronous circuit techniques. Moreover, designfor-test (DfT) techniques are required [6] to detect undefined state faults (USFs) during memory operation (not covered in this paper). In the context of our case study, Fig.…”
Section: B Ad-hoc Read/write Driver For Logic Operationsmentioning
confidence: 99%
See 1 more Smart Citation
“…Adaptive write methods, multi-level sensing as well as complementary logic operations in the periphery and parallelization, are some issues to be taken into consideration in the design of the memory read/write drivers, which can require asynchronous circuit techniques. Moreover, designfor-test (DfT) techniques are required [6] to detect undefined state faults (USFs) during memory operation (not covered in this paper). In the context of our case study, Fig.…”
Section: B Ad-hoc Read/write Driver For Logic Operationsmentioning
confidence: 99%
“…It should guarantee a universal logic set and offer flexibility of data movement, required for multi-level (sequential) logic computations. Moreover, device variability is a reliability limiting factor, so its effects must be mitigated at circuit level with proper read/write methodologies that incorporate testability during normal circuit operation [6]. Furthermore, ad-hoc synthesis tools are required to bridge the gap between primitive logic gates and large-scale logic circuits.…”
Section: Introductionmentioning
confidence: 99%