Model-Based Testing for Embedded Systems 2017
DOI: 10.1201/b11321-14
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Automated Statistical Testing for Embedded Systems

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Cited by 18 publications
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“…However, testing large SPLs demand substantial effort, and effective reuse is a challenge. Model-Based Testing (MBT) approaches need to be adapted to the SPL domain (see [27] for a survey of existing approaches).…”
Section: Introductionmentioning
confidence: 99%
“…However, testing large SPLs demand substantial effort, and effective reuse is a challenge. Model-Based Testing (MBT) approaches need to be adapted to the SPL domain (see [27] for a survey of existing approaches).…”
Section: Introductionmentioning
confidence: 99%