2008 Second International Conference on Secure System Integration and Reliability Improvement 2008
DOI: 10.1109/ssiri.2008.48
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Automated Fault Diagnosis in Embedded Systems

Abstract: Abstract. Automated fault diagnosis is emerging as an important factor in achieving an acceptable and competitive cost/dependability ratio for embedded systems. In this paper, we introduce model-based diagnosis and spectrum-based fault localization, two state-of-the-art approaches to fault diagnosis that jointly cover the combination of hardware and control software typically found in embedded systems. In this paper we present an introduction to the field, discuss our recent research results, and report on the… Show more

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Cited by 17 publications
(9 citation statements)
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“…In general, however, the faulty component(s) may be outranked by other components, entailing non-zero search effort by the users. Research has shown that for small programs (O(100) lines) 5 − 20% of the code remains to be inspected by the user [12]. However, for large programs this fraction drops to less than a percent [3], making SFL an interesting debugging aid.…”
Section: Fault Localizationmentioning
confidence: 99%
“…In general, however, the faulty component(s) may be outranked by other components, entailing non-zero search effort by the users. Research has shown that for small programs (O(100) lines) 5 − 20% of the code remains to be inspected by the user [12]. However, for large programs this fraction drops to less than a percent [3], making SFL an interesting debugging aid.…”
Section: Fault Localizationmentioning
confidence: 99%
“…Manifestations of (b) are frequently found in today's era of the Internet of Things (IoT), distributed or autonomous systems, and ubiquitous computing, where low-end microprocessors, often with only a small amount of RAM, are incorporated into almost any device. Whenever such devices should perform (self-)diagnosing actions [27,28], memory-limited diagnosis algorithms are a must [29,30].…”
Section: Introductionmentioning
confidence: 99%
“…As the spectra are captured by automatic profiling, and as the test oracles are readily implemented from existing specifications, no modeling effort is required. Benchmark studies, as well as case studies by the authors diagnosing embedded software (100 KLOC) from Philips Semiconductors (now NXP) have shown promising results [5], [6], [7]. Recently, a model-based approach to SFL has been presented [8] where the statistical approach has been replaced by a reasoning approach.…”
Section: Introductionmentioning
confidence: 99%