Automated characterization of TAS-MRAM test arrays

Abstract

In this work the characterization results of 1kbit TAS-MRAM arrays obtained through RIFLE Automated Test Equipment of 1Kbit array are reported. Such ATE, ensuring flexibility in terms of signals and timing, allowed evaluating hysteresis and to perform 50k write cycles in a very limited time, getting a first insight on TAS-MRAM arrays performance and reliability

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays

“…The ATE can be easily modified adding/replacing waveform generators to satisfy specific requests for the memory technology without requiring any successive calibrations, granting de-facto its applicability to other NVM technologies. The performance and effectiveness of the proposed ATE has been preliminary demonstrated in [12], [13] and here is fully validated on different MRAM and RRAM test arrays.…”

Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications

“…This is possible by comparing the measured resistance with a reference resistor, hence its designation as "fixed reference". The performance figures of this technological option have been evaluated for automotive environments in state-of-art [5][6][7]. Despite the good reliability envisioned, there are still some issues in terms of data retention properties at high temperatures that should be carefully evaluated.…”

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions

“…Such a technology is already at an intermediate maturity level, that calls for the evaluation of its potentialities at an integrated array level. Many experimental works [8], [9] still show the good performances of single cells structures, whereas only few analyze the behavior of entire arrays [10], [11]: a full array characterization is mandatory to evaluate the cell-to-cell variability and to extract statistical parameters fully representing the memory array.…”