Author response for "Temperature dependence of &lt;scp&gt;ESD&lt;/scp&gt; effects on 28 nm &lt;scp&gt;FD‐SOI MOSFETs&lt;/scp&gt;"

Xiao, Yiping; Liu, Chaoming; Zhang, Yanqing; Qi, Chenze; Ma, Guoqiang; Wang, Tianqi; Huo, Mingxue

doi:10.1002/eng2.12729/v2/response1

2023

DOI: 10.1002/eng2.12729/v2/response1

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Author response for "Temperature dependence of <scp>ESD</scp> effects on 28 nm <scp>FD‐SOI MOSFETs</scp>"

Yiping Xiao¹,

Chaoming Liu²,

Yanqing Zhang³

et al.

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Author response for "Temperature dependence of <scp>ESD</scp> effects on 28 nm <scp>FD‐SOI MOSFETs</scp>"

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