Auger electron spectroscopy - a local probe for solid surfaces

Weißmann, R.; Müller, K.

doi:10.1016/0167-5729(81)90005-4

Cited by 202 publications

(33 citation statements)

References 89 publications

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“…The assumption of an s-wave emission can be supported by the theory of Auger emission [23]. where we have previously seen that the multiple-scattering formalism and Augerbased experiments 'do not match well peak for peak [8].…”

mentioning

confidence: 73%

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

et al. 1989

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Angular profiles of "Kikuchi" and Auger electrons were measured and interpreted for a clean Ni(100) surface and a slightly oxidized Mg(OOOI) surface. Theoretical analysis of the data using forward focusing of the medium-energy electrons (500-1500 e V) shows that both Kikuchi and Auger electrons can be well represented as s-waves emitted from atomic sites. The Auger electron data are used to analyze the structure of slightly oxidized Mg(OOOI), yielding oxygen atom positions in the octahedral interstitial sites in the first two interlayer spacings of the metal.

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mentioning

confidence: 73%

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

et al. 1989

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“…The signal contains both positive and negative components. For quantitative Auger analysis it is mandatory to separate the two contributions to the total signal [22,23]. The principal signal seen at 47 eV comes from an M2 5 3VV Auger transition.…”

Section: Figurementioning

confidence: 99%

Bayesian background estimation

Fischer

Dose

Hanson

et al. 2001

AIP Conference Proceedings

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Abstract. The ubiquitous problem of estimating the background of a measured spectrum is solved with Bayesian probability theory. A mixture model is used to capture the defining characteristics of the problem, namely that the background is smoother than the signal. The smoothness property is quantified in terms of a cubic spline basis where a variable degree of smoothness is attained by allowing the number of knots and the knot positions to be adaptively chosen on the basis of the data. The fully Bayesian approach taken provides a natural way to handle knot adaptivity, allows uncertainties in the background to be estimated and data points to be classified in groups containing only background and groups with additional signal contribution. Our technique is demonstrated on a PIXE spectrum from a geological sample and an Auger spectrum from an 10 monolayer iron film on tungsten.

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“…Because, the atomic Auger matrix elements, do not vary much as function of energy [2,3] and contribute only to the peak intensity in the A(E) spectrum and not to the peak position. The the number of the decay channels is governed by the selection rules of the atomic angular momentum of the electrons involved in the Auger process [3,10,19].…”

Section: Partial Ldos (Pldos)mentioning

confidence: 99%

“…Earlier studies [2][3][4][5][6][7][8][9][10][11][12] showed that analysis of the lineshape of the Core Valence Valence (CVV) Auger spectrum can provide information of the local chemical environment of the target atomic species. However, the CVV Auger intensity, A(E), becomes distorted by all kind of losses such as elastic and inelastic scattering, interaction with collective oscillations (plasmons, etc.)…”

Section: Introductionmentioning

confidence: 99%

The influence of the (2 × 1) reconstruction of the Si(1 0 0) surface on the SiL2,3 VV Auger lineshape

Sasse

Hoef

Wormeester

et al. 1989

Solid State Communications

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The extreme surface sensitiveness of the Si-L2.3VV Auger process and its ability to probe the atomic electron distribution in the direct neighbourhood of the L2.3-core-hold makes this electron spectroscopic technique a candidate for investigations of the local changes in the electron distribution due to surface reconstruction. In this paper we show, explicitly, the influence of the (2 x 1) reconstruction of the Si(l 00) surface on the Si-L2.3W Auger lineshape. Furthermore, the calculated Auger lineshape will be compared with an experimentally obtained line profile.

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Auger electron spectroscopy - a local probe for solid surfaces

Cited by 202 publications

References 89 publications

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

Forward focusing of Auger and Kikuchi electrons for surface structure determination: Ni(100) and oxidized Mg(0001)

Bayesian background estimation

The influence of the (2 × 1) reconstruction of the Si(1 0 0) surface on the SiL2,3 VV Auger lineshape

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