Auger Effect of Hole Accumulation on Characteristics of InAlAs/InGaAs HEMTs

Taguchi, Hayao; Murakami, Hiroaki; Oura, Mashashi; Iida, Tsutomu; Takanashi, Yoshifumi

doi:10.7567/ssdm.2006.p-6-4

Extended Abstracts of the 2006 International Conference on Solid State Devices and Materials 2006

DOI: 10.7567/ssdm.2006.p-6-4

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Auger Effect of Hole Accumulation on Characteristics of InAlAs/InGaAs HEMTs

Hayao Taguchi¹,

Hiroaki Murakami²,

Mashashi Oura³

et al.

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Auger Effect of Hole Accumulation on Characteristics of InAlAs/InGaAs HEMTs

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