Mass attenuation coefficients (μ/ρ) for Zr, Nb, Mo and Pd elements around their K-edges are measured at 14 energies in the range 15.744-28.564 keV using secondary excitation from thin Zr, Nb, Mo, Rh, Pd, Cd and Sn foils. The measurements were carried out at the Kα and K β energy values of the target elements by two techniques:(1) Proton-induced X-ray emission (PIXE) and (2) 241 Am (300 mCi) source. In PIXE, 2 MeV proton-excited X-rays were detected by a Si(Li) detector. In the second case, X-rays excited by 59.54 keV photons from the targets were counted by an HPGe detector under a narrow beam good geometry set-up with sufficient shielding. The results are consistent with theoretical values derived from the XCOM package and indicate that the PIXE data have better statistical accuracy.