ATPG of Digital Electronic Systems BIST Based on D-PL Chaotic Model

Zhu, Ming; Chen, Yu; Yang, Chunling; Zhao, Dongyang

doi:10.1109/isdea.2012.514

Cited by 3 publications

(1 citation statement)

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“…The time series generated by the chaotic model has the pseudo randomness, the small correlation, the ergodic property, the randomness and the initial value sensitivity [9]. The time series generated by chaotic model have good pseudorandom property, which can improve the fault detection rate and fault isolation rate in a certain extent [10].…”

Section: The Construction Of D-m Chaotic Atpgmentioning

confidence: 99%

A D-M Chaotic Model ATPG in Mixed Circuits BIST

Zhu¹,

Lin²,

Wang³

et al. 2017

dtcse

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Abstract. In order to realize BIST (Built-In Self-Test) of mixed circuits, the D-M chaos ATPG (Auto Test Pattern Generator) method is proposed in this paper. The features of time series generated by D-M chaos model are analyzed to prove that it can be used in ATPG. The ATPG is a wide spectrum of signal sequences, and its correlation is small and close to the white noise, so it can be used in digital circuits BIST. Furthermore, in order to make it can be used in the test of analog circuits, the chaotic time series is reconstructed. FPGA is used as BIST controller of digital-analog mixed circuits test system to validate this method. The experimental results show that the proposed method can effectively identify the fault in mixed-signal circuits, and it can be used in mixed circuits BIST as a general method.

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Section: The Construction Of D-m Chaotic Atpgmentioning

confidence: 99%