2018
DOI: 10.1166/jnn.2018.14594
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Atomistic Structural Variation via Electromigration in Molten-State Gold Nanocontacts

Abstract: The atomistic structural variation in gold nanocontacts (NCs) due to applied voltage pulses was examined inside a transmission electron microscope. This examination was accompanied by simultaneous conductance measurements. The NCs melted during the passage of 4 ns long voltage pulses, with voltages in the 0.75-1.30 V range. Electromigration occurred in the molten state, and was directed from the positively-biased electrode to the negatively-biased electrode, which opposes the observed direction convention of m… Show more

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Cited by 7 publications
(11 citation statements)
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“…Nanosecond-pulsewave application is one of the candidates of such processing methods. [9][10][11] However, the studies on the pulse application method hover at an early stage, with a simple observation of the structural variation between crystal and amorphous states in NCs of only several elements. In this study, we demonstrate an atomistic control of the external shape and texture of tungsten (W) NCs through electromigration (EM) and amorphization using the pulse-wave-application method.…”
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confidence: 99%
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“…Nanosecond-pulsewave application is one of the candidates of such processing methods. [9][10][11] However, the studies on the pulse application method hover at an early stage, with a simple observation of the structural variation between crystal and amorphous states in NCs of only several elements. In this study, we demonstrate an atomistic control of the external shape and texture of tungsten (W) NCs through electromigration (EM) and amorphization using the pulse-wave-application method.…”
mentioning
confidence: 99%
“…Such directional change of the EM during the pulse application has been also observed in gold and tantalum (Ta) NCs. 10,11) The EM direction is determined by the magnitude relationship between direct forces along the positive-to-negative direction (F el ) acting on the ion cores and electron wind forces acting on the atoms (F wd ) along the opposite direction; negative-to-positive direction for |F wd |=F el > 1 and opposite direction for |F wd |=F el < 1. 19,20) The ratio |F wd |=F el is equal to |Z wd |=Z el , where Z wd and Z el are the effective charge number owing to the electron wind and effective charge number, respectively.…”
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confidence: 99%
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“…Thus, electromigration occurred from the positively biased side to the negatively biased side, resulting in growth of a NW via pulse application. The electromigration direction implies that the constriction region melts once during the pulse application 17 . The NW length increased to 3.1 nm after 18 pulses, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The surface reconstruction observed in this study was caused by electromigration via pulsed voltage application under tensile stress conditions. Electromigration occurs predominantly at surfaces 17 , 27 . As observed in Fig.…”
Section: Discussionmentioning
confidence: 99%