Atomic Structure of La₀₆₇Ca_0.33MnO₃ Thin Films on LaAlO₃

Abstract

<jats:p>Thin films of doped perovskite manganites of the type R<jats:sub>1-X</jats:sub> A<jats:sub>x</jats:sub>MnO<jats:sub>3-y</jats:sub> are currently become the focus of intense theoretical and experimental research due to their promising technological implications. However, the microstructure of the film and the interface structure at the atomic level remains unclear. In this report, we will present the atomic structure of the film/substrate interface and the microstructure of the film using a combination of transmission electron microscopy (TEM), Z-contrast scanning transmission microscopy (STEM), and electron energy loss spectroscopy (EELS).</jats:p><jats:p>The La<jats:sub>0.67</jats:sub>Ca<jats:sub>0.33</jats:sub>MnO<jats:sub>3</jats:sub> (LCMO) samples were grown on (001) LaA1O<jats:sub>3</jats:sub> (LAO) using pulsed laser deposition. X-ray diffraction indicated the films to be oriented with the [001] directions parallel to the &lt;001&gt; directions of the pseudo-cubic perovskite LAO. Rocking curve measurements using the (002) reflection from the film indicated a full width half maximum of less than 0.3°. A Philips EM-400 electron microscope at 100 kV and a VG HB603 STEM at 300 kV were employed for sample analysis.</jats:p>