2007
DOI: 10.1021/nl070613a
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Atomic Structure of Graphene on SiO2

Abstract: We employ scanning probe microscopy to reveal atomic structures and nanoscale morphology of graphene-based electronic devices (i.e., a graphene sheet supported by an insulating silicon dioxide substrate) for the first time. Atomic resolution scanning tunneling microscopy images reveal the presence of a strong spatially dependent perturbation, which breaks the hexagonal lattice symmetry of the graphitic lattice. Structural corrugations of the graphene sheet partially conform to the underlying silicon oxide subs… Show more

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Cited by 1,449 publications
(1,477 citation statements)
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References 27 publications
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“…[12] Indeed, in more recent studies, inert electrical responses (i.e., no response) for gaseous NH 3 were observed by annealing the exfoliated graphene at high temperature (400 °C) in Ar/H 2 atmosphere to remove possible polymer contaminations and produce atomically clean graphene sheets. [178] This inert sensing behavior of the cleaned graphene sensors is robust even upon the exposure to NH 3 vapor at a concentration of 1000 ppm (Fig. 5c) [11] and to dimethylmethylphosphonate (DMMP) vapor at a concentration of 100 ppm (Fig.…”
Section: Gfet Gas and Ion Sensorsmentioning
confidence: 93%
“…[12] Indeed, in more recent studies, inert electrical responses (i.e., no response) for gaseous NH 3 were observed by annealing the exfoliated graphene at high temperature (400 °C) in Ar/H 2 atmosphere to remove possible polymer contaminations and produce atomically clean graphene sheets. [178] This inert sensing behavior of the cleaned graphene sensors is robust even upon the exposure to NH 3 vapor at a concentration of 1000 ppm (Fig. 5c) [11] and to dimethylmethylphosphonate (DMMP) vapor at a concentration of 100 ppm (Fig.…”
Section: Gfet Gas and Ion Sensorsmentioning
confidence: 93%
“…nanoelectronic devices). The graphene corrugations observed by a novel combined SEM/AFM/STM technique are suggested to be attributed to the partial conformation of the graphene to the SiO 2 , not to the intrinsic corrugations of graphene [316]. Besides, species like H 2 O may be trapped at the graphene/SiO 2 interface [317,318].…”
Section: Disorders In Graphene Structurementioning
confidence: 99%
“…The line defects (or GBs) are expected to be avoid by controlling the nucleation of graphene grains using seeded growth, and to synthesize spatially ordered arrays of graphene grains with pre-determined locations [78]. Lastly, cleaning of transferred graphene surface can be efficiently done by annealing in a clean or reducing environment such as vacuum, H 2 /N 2 or H 2 /Ar [316,324,325]. …”
Section: Disorders In Graphene Structurementioning
confidence: 99%
“…Next we placed the sample in a vacuum chamber, and under continuous pumping we observed the Fermi level to gradually move toward the Dirac point. 35,36 Finally, after vacuum pumping for 2 days, the Dirac point voltage moved to a value < +20 V, as the turquoise line shows.In conclusion, we have studied the transmission properties of large-area graphene films in the THz and IR range. By applying an external gate voltage, we were able to electrically tune the Fermi level of graphene, which in turn modulated the transmission of THz and IR waves.…”
mentioning
confidence: 96%
“…Next we placed the sample in a vacuum chamber, and under continuous pumping we observed the Fermi level to gradually move toward the Dirac point. 35,36 Finally, after vacuum pumping for 2 days, the Dirac point voltage moved to a value < +20 V, as the turquoise line shows.…”
mentioning
confidence: 96%