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2022
DOI: 10.1016/j.actamat.2022.118010
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Atomic structure and electrical/ionic activity of antiphase boundary in CH3NH3PbI3

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Cited by 7 publications
(5 citation statements)
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“…DFT calculations further suggest that the APBs repel electrons and holes, facilitating fast ion diffusion. [49,50] In addition, a few atomic layers on the sides of an individual RP-APB show strain concentration (indicated by arrows in Figure 2B,C), while the strain concentration in a broader area on the side of GB can be observed in Figure 2F. It can be interpreted that the compressive strain could be effectively compensated during the formation of RP-APB originating from edge-type partial dislocations.…”
Section: Resultsmentioning
confidence: 92%
See 1 more Smart Citation
“…DFT calculations further suggest that the APBs repel electrons and holes, facilitating fast ion diffusion. [49,50] In addition, a few atomic layers on the sides of an individual RP-APB show strain concentration (indicated by arrows in Figure 2B,C), while the strain concentration in a broader area on the side of GB can be observed in Figure 2F. It can be interpreted that the compressive strain could be effectively compensated during the formation of RP-APB originating from edge-type partial dislocations.…”
Section: Resultsmentioning
confidence: 92%
“…DFT calculations further suggest that the APBs repel electrons and holes, facilitating fast ion diffusion. [ 49,50 ]…”
Section: Resultsmentioning
confidence: 99%
“…However, the critical dose identified by this protocol sets up an important reference by limiting the total maximum dose allowed to avoid beam-induced artifacts for further TEM-based characterizations. For example, unveiling atomic structural information on intragrain planar defects, such as antiphase boundary [65] and twin/stacking fault, [19] by reliable S/TEM imaging approach, facilitates the construction of accurate lattice models for optimization of high performance and stable OIHP devices. [18,66]…”
Section: Main Textmentioning
confidence: 99%
“…One major hurdle in this research direction is to reliably image the microstructure and dynamics of intragrain defects and impurities in perovskites 3,[17][18][19][20] . Transmission electron microscopy (TEM) is a workhorse tool for materials characterization with high spatial resolution, which has been leveraged to demonstrate unambiguous observation of atomic-scale details of perovskites [21][22][23][24][25] . In a recent study, we reported a simple, modified scanning TEM (STEM) method in conjunction with focus ion beam (FIB) nanofabrication of perovskite sample specimen, which allows direct, reliable observation of perovskite microstructures that are embedded in PSCs 26 .…”
mentioning
confidence: 99%