2017
DOI: 10.1021/acs.chemmater.7b00183
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Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control

Abstract: Hexagonal boron nitride (h-BN) is a promising two-dimensional insulator with a large band gap and low density of charged impurities that is isostructural and isoelectronic with graphene. Here we report the chemical and atomic-scale structure of CVD-grown wafer-scale (~25 cm 2 ) h-BN sheets

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Cited by 38 publications
(33 citation statements)
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References 42 publications
(61 reference statements)
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“…The E 2g modes were fit with a Lorentzian, giving full‐width at half maximum of 24.35 cm −1 for the standard grown hBN, which decreases to 17.60 and 15.90 cm −1 for preoxidized and gettering growth conditions, respectively (Figure S7, Supporting Information). This confirms the superior crystallinity of hBN grown films by the gettering method . The increasing crystallinity can be ascribed to modification of the Cu catalyst during gettering growth, which slows nucleation and growth kinetics, and reduces the effects of lattice constant changes, and high defect density growth during cooling by boron precipitation from the catalyst .…”
Section: Comparison Of Emission Energy and Density Of Cvd Hbn Spes Insupporting
confidence: 56%
“…The E 2g modes were fit with a Lorentzian, giving full‐width at half maximum of 24.35 cm −1 for the standard grown hBN, which decreases to 17.60 and 15.90 cm −1 for preoxidized and gettering growth conditions, respectively (Figure S7, Supporting Information). This confirms the superior crystallinity of hBN grown films by the gettering method . The increasing crystallinity can be ascribed to modification of the Cu catalyst during gettering growth, which slows nucleation and growth kinetics, and reduces the effects of lattice constant changes, and high defect density growth during cooling by boron precipitation from the catalyst .…”
Section: Comparison Of Emission Energy and Density Of Cvd Hbn Spes Insupporting
confidence: 56%
“…Spectroscopic Characterizations. Raman scattering is known to be a sensitive tool to detect the disorder induced by impurities and defects, which have been demonstrated to be very effective in studying graphene-like materials (55,56). The Raman spectra are presented in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…To test the effect of measurement environment and h-BN crystal morphology on inhomogeneous broadening we transfer 5-nm-thick CVD-grown h-BN films from the copper growth substrate onto SiO 2 and ITO substrates using wet-transfer techniques (for details about the growth method, see Ref. [51] and the Supplemental Material [41]). We also exfoliate a 5-nm-thick h-BN onto SiO 2 substrate and an 8-nm-thick h-BN onto the ITO substrate.…”
Section: B Low-temperature Broadening and The Substrate Effectsmentioning
confidence: 99%