2021
DOI: 10.1126/sciadv.abh2716
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Atomic-scale fatigue mechanism of ferroelectric tunnel junctions

Abstract: Role of charged defects in resistance fatigue of ferroelectric tunnel junctions has been revealed at atomic scale.

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Cited by 32 publications
(28 citation statements)
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“…The fitted d is consistent with the measured thickness (∼3 nm) of PZT film by STEM in Figure a, suggesting that the Schottky barrier at the NSTO surface is almost eliminated at the ON state (see SI Section 2 for detailed discussions) . The Δϕ is related to the difference between the work functions of Ti (4.33 eV) and NSTO (4.2–4.3 eV). , The direct tunneling at the ON state and the obvious rectification effect at the OFF state are consistent with previous reports on MFS-type FTJs. ,, …”
Section: Resultssupporting
confidence: 89%
“…The fitted d is consistent with the measured thickness (∼3 nm) of PZT film by STEM in Figure a, suggesting that the Schottky barrier at the NSTO surface is almost eliminated at the ON state (see SI Section 2 for detailed discussions) . The Δϕ is related to the difference between the work functions of Ti (4.33 eV) and NSTO (4.2–4.3 eV). , The direct tunneling at the ON state and the obvious rectification effect at the OFF state are consistent with previous reports on MFS-type FTJs. ,, …”
Section: Resultssupporting
confidence: 89%
“…Dynamically changing the read bias with cycling would somewhat counteract the observed TER fatigue in the samples. A faster fatigue rate with increased applied electric field has been reported in other works as well and was attributed to increased oxygen vacancy generation and aggregation with switching . The growth of a dead-layer was also observed in that case, which in our case does not seem likely, as we do not observe an increase of E c with cycling.…”
Section: Resultssupporting
confidence: 85%
“…A faster fatigue rate with increased applied electric field has been reported in other works as well and was attributed to increased oxygen vacancy generation and aggregation with switching. 42 The growth of a dead-layer was also observed in that case, which in our case does not seem likely, as we do not observe an increase of E c with cycling. Contrary to our improved fatigue performance at lower switching fields, Li et al present an increased rate of fatigue for nonsaturated switching of the ferroelectric, 43 a characteristic not observed in this study.…”
Section: ■ Resultssupporting
confidence: 57%
“…The ferroelectric domain switching dynamics can be obtained directly from the resistance switching dynamics by considering the FTJ as a parallel circuit of upward and downward polarization domains 35 . The relationship between the area fraction s for upward polarization domains and the junction resistance can be expressed as 1 /R = (1 − s ) /R L + s/R H 35 , 45 . Fig 3c shows that the pulse duration dependence of s at different V p has a plateau, suggesting the multistep ferroelectric switching process.…”
Section: Resultsmentioning
confidence: 99%