2007 7th IEEE Conference on Nanotechnology (IEEE NANO) 2007
DOI: 10.1109/nano.2007.4601352
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Atomic-scale analysis of polydiacetylene nanowires by scanning tunneling microscopy

Abstract: Scanning tunneling microscopy (STM) has been used to study polydiacetylene nanowires, a candidate material for molecular electronic interconnects. STM analysis across different voltages shows that the substrate material contributes to hole doping in the nanowires. Changing the substrate material causes a substantial change in the apparent height of the nanowires in STM images, revealing a previouslyoverlooked dependence of the electronic structure upon the substrate electrode material. Polydiacetylene nanowire… Show more

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