Atomic Resolution with Atomic Force Microscope

Binnig, G.; Gerber, Ch.; Stoll, E.; Albrecht, T. R.; Quate, C. F.

doi:10.1209/0295-5075/3/12/006

Cited by 519 publications

(90 citation statements)

References 18 publications

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“…AFM images sample surfaces by continuous scanning with a sharp tip. In simple contact mode AFM, a tip at the end of a flexible cantilever is used to detect sub-nanometer size changes in the interactional force as a function of height for the molecular surface, resulting in a 2-dimensional plot of topographic features [35,36]. In semi-contact tapping mode atomic force microscopy (TM-AFM), the topographic image is collected from any type of (hard or soft) surface with an oscillating probe tip driven near its resonance frequency by a piezoelectric transducer that provides a driving force of a constant amplitude [37,38].…”

Section: Introductionmentioning

confidence: 99%

Electrical and interface properties of Au/DNA/n-Si organic-on-inorganic structures

Okur

Yakuphanoğlu

Ozsoz

et al. 2009

Microelectronic Engineering

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Section: Introductionmentioning

confidence: 99%

Electrical and interface properties of Au/DNA/n-Si organic-on-inorganic structures

Okur

Yakuphanoğlu

Ozsoz

et al. 2009

Microelectronic Engineering

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“…The atomic force microscope (AFM) (1) has been primarily employed to examine the topography of surfaces with atomic or molecular resolution (2)(3)(4)(5)(6)(7). It has also been used to measure molecular friction (8,9) and elasticity (10).…”

mentioning

confidence: 99%

Direct measurement of hydrogen bonding in DNA nucleotide bases by atomic force microscopy.

Boland

Ratner

1995

Proc. Natl. Acad. Sci. U.S.A.

232

142

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We have used self-assembled purines and pyrimidines on planar gold surfaces and on gold-coated atomic force microscope (AFM) tips to directly probe intermolecular hydrogen bonds. Electron spectroscopy for chemical analysis (ESCA) and thermal programmed desorption (TPD) measurements of the molecular layers suggested monolayer coverage and a desorption energy of about 25 kcal/mol.Experiments were performed under water, with all four DNA bases immobilized on AFM tips and flat surfaces. Directional hydrogen-bonding interaction between the tip molecules and the surface molecules could be measured only when opposite base-pair coatings were used. The directional interactions were inhibited by excess nucleotide base in solution. Nondirectional van der Waals forces were present in all other cases. Forces as low as two interacting base pairs have been measured. With coated AFM tips, surface chemistry-sensitive recognition atomic force microscopy can be performed.Direct measurements of intermolecular forces are of great interest because such forces dominate the behavior of all materials and biological systems. The atomic force microscope (AFM) (1) has been primarily employed to examine the topography of surfaces with atomic or molecular resolution (2-7). It has also been used to measure molecular friction (8, 9) and elasticity (10). In addition, it has been applied to measure colloidal forces between a sphere and a planar silica surface (11,12). Further, the ability to directly measure forces between molecules suggests the possibility to probe for the chemical interaction between tips and surface molecules. Consequently, investigators measured the forces between metal tips and metal surfaces (10, 13) and the forces between tungsten tips and molecular films on surfaces (14,15). IHoh et al (15, 16) investigated the pH dependence of forces between a silicon nitride tip and a glass substrate in aqueous solutions. However, in the previous studies, the surface chemistry of sample and probe was not well defined and was poorly characterized. The interpretation of the measured forces is further complicated because the glass surface properties under such conditions may be closer to those of a silica gel than to those of the original glass (17). Molecular recognition forces have been measured by using the specific interactions between the ligand-receptor pair streptavidin-biotin (18, 19) as well as between complementary DNA strands (20). Here we use DNA base pairing to demonstrate that the AFM can directly measure directional hydrogen bonding in well-defined, ordered systems. Although hydrogen bonding is generally nondirectional (21), the shape of the nucleotide bases renders the hydrogen-bonding interaction remarkably orientation specific (22). We present evidence that we can measure this specific interaction between bases that have obvious biological significance.EXPERIMENTAL PROCEDURES AFM Tips. Mica (Structure Probe) and AFM silicon nitride (Digital Instruments, Santa Barbara, CA) pyramidal tips were gold coated by a dc a...

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“…The autocorrelation of figure 3a (Fig. 3c) 6.5 Â measured on pure MnPS3 surface as well as on intercalate surface could be assigned to the distance between phosphorus atoms of two P-P pairs (within the estimated error of 10% due to the drift and other uncertainties of the AFM) (Fig. 1).…”

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confidence: 68%

“…Imaging of MnPS3 lamellar material and of Mn1-xPS3K2x(H2O) [1][2][3][4][5] and AFM [6][7][8][9] [25][26][27][28][29]. Moreover, the resulting intercalation products are perfectly air stable over very long periods [27].…”

mentioning

confidence: 99%

Imaging of MnPS3 lamellar material and of Mn1- xPS3K2x(H2O) (x = 0.2) intercalated compound by Atomic Force Microscopy

Lagadic

Clément²

1993

Microsc. Microanal. Microstruct.

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plane is naturally observed, with a S-S distance (3.5 Å) in good agreement with the crystallographic structure. Moreover, we measured an other periodic spacing (6.5 A) which also appears on the images of the potassium intercalate surface. This feature is discussed in terms of structural modifications inside a MnPS3 sheet. The presence of guest species in the interlamellar space could explain this modification. In the case of pure MnPS3, water molecules could be reversibly inserted between the layers, thus disturbing the slab structure.

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Atomic Resolution with Atomic Force Microscope

Abstract: The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 fi.

Cited by 519 publications

References 18 publications

Electrical and interface properties of Au/DNA/n-Si organic-on-inorganic structures

Electrical and interface properties of Au/DNA/n-Si organic-on-inorganic structures

Direct measurement of hydrogen bonding in DNA nucleotide bases by atomic force microscopy.

Imaging of MnPS3 lamellar material and of Mn1- xPS3K2x(H2O) (x = 0.2) intercalated compound by Atomic Force Microscopy

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