Atomic-Resolution Dynamic Force Microscopy and Spectroscopy of a Single-Walled Carbon Nanotube: Characterization of Interatomic van der Waals Forces

Ashino, Makoto; Schwarz, Alexander; Behnke, Timo; Wiesendanger, R.

doi:10.1103/physrevlett.93.136101

Cited by 89 publications

(83 citation statements)

References 25 publications

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“…As mentioned earlier, recent developments in the force microscopy techniques makes it feasible to measure the force between the cantilever and the substrate even in atomic resolution [108] e.g. for measuring the interactions in the nanotube composites.…”

Section: Atomic Force Microscopy Involved Techniquesmentioning

confidence: 99%

A review on the role of interface in mechanical, thermal, and electrical properties of polymer composites

Kashfipour

Mehra

Zhu

2018

Adv Compos Hybrid Mater

161

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Composite materials and especially polymer composites are widely used in daily life and different industries due to their vastly different properties and design flexibility. It is known that the properties of the composites are strongly related to the properties of its constituents. However, it has been reported in many studies, experimentally and by simulations, that the characteristics of the composites do not follow the rule of mixing. It means that in addition to properties of the constituents, there are other parameters affecting the final physicochemical properties of composites. The interfacial interactions between fillers and host is one of the factors which can strongly affect the properties of the composite. In this review, we summarized the type of interactions between the constituents, their improvement techniques, interaction measurement methods, and the effects of interfacial interactions on thermal, mechanical, and electrical properties of composites.

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Section: Atomic Force Microscopy Involved Techniquesmentioning

confidence: 99%

A review on the role of interface in mechanical, thermal, and electrical properties of polymer composites

Kashfipour

Mehra

Zhu

2018

Adv Compos Hybrid Mater

161

View full text Add to dashboard Cite

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“…FS has been used to discriminate between the two ionic sublattices on several insulator surfaces, [18][19][20][21][22] to achieve single-atom chemical identification on semiconductors, 23 and to understand the nc-AFM contrast on carbon nanostructures. 24,25 In this work we combine site-specific force measurements and extensive first-principles calculations on TiO 2 (110)-1 × 1, aiming to clarify the origin of the observed nc-AFM contrast and to characterize the tip structures responsible for the protrusion and hole imaging modes. While many tip models could be compatible with forces and contrast on typical imaging distances, our data close to the force minima is only consistent with a tip apex contaminated with clusters of surface material.…”

Section: Introductionmentioning

confidence: 99%

Understanding image contrast formation in TiO2with force spectroscopy

et al. 2012

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Site-specific force measurements on a rutile TiO 2 (110) surface are combined with first-principles calculations in order to clarify the origin of the force contrast and to characterize the tip structures responsible for the two most common imaging modes. Our force data, collected over a broad range of distances, are only consistent with a tip apex contaminated with clusters of surface material. A flexible model tip terminated with an oxygen explains the protrusion mode. For the hole mode we rule out previously proposed Ti-terminated tips, pointing instead to a chemically inert, OH-terminated apex. These two tips, just differing in the terminal H, provide a natural explanation for the frequent contrast changes found in the experiments. As tip-sample contact is difficult to avoid while imaging oxide surfaces, we expect our tip models to be relevant to interpret scanning probe studies of defects and adsorbates on TiO 2 and other technologically relevant metal oxides.

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“…Dynamic AFM [1] in the frequency modulation (FM) mode [2] has resolved the true geometric structure of a broad range of materials [3][4][5]. FM AFM experiments on carbon-based materials [6][7][8][9][10][11][12][13] show atomic contrast in Δf images and, depending on the setup, in the dissipation channel. While the origin of the dissipation is not well understood, the Δf contrast has been linked with the nature of the tip-sample interaction [14].…”

mentioning

confidence: 99%

Atomic-Scale Variations of the Mechanical Response of 2D Materials Detected by Noncontact Atomic Force Microscopy

et al. 2016

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We show that noncontact atomic force microscopy (AFM) is sensitive to the local stiffness in the atomicscale limit on weakly coupled 2D materials, as graphene on metals. Our large amplitude AFM topography and dissipation images under ultrahigh vacuum and low temperature resolve the atomic and moiré patterns in graphene on Pt(111), despite its extremely low geometric corrugation. The imaging mechanisms are identified with a multiscale model based on density-functional theory calculations, where the energy cost of global and local deformations of graphene competes with short-range chemical and long-range van der Waals interactions. Atomic contrast is related with short-range tip-sample interactions, while the dissipation can be understood in terms of global deformations in the weakly coupled graphene layer. Remarkably, the observed moiré modulation is linked with the subtle variations of the local interplanar graphene-substrate interaction, opening a new route to explore the local mechanical properties of 2D materials at the atomic scale. DOI: 10.1103/PhysRevLett.116.245502 Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are tools of choice for characterizing the unique mechanical and electronic properties of graphene (G) and other 2D materials. Dynamic AFM [1] in the frequency modulation (FM) mode [2] has resolved the true geometric structure of a broad range of materials [3][4][5]. FM AFM experiments on carbon-based materials [6][7][8][9][10][11][12][13] show atomic contrast in Δf images and, depending on the setup, in the dissipation channel. While the origin of the dissipation is not well understood, the Δf contrast has been linked with the nature of the tip-sample interaction [14].G properties can be efficiently tuned by the interaction with metals [15,16]. The interaction strength varies widely from the strong coupling with Rh [17,18] and Ru [19] to the weak limit (Ir [20], Pt [21]), where G retains its unique electronic properties [22]. The different lattice parameters of G and the metal underneath are accommodated through the formation of commensurate structures known as moiré patterns, where C atoms become inequivalent due to their different bonding configuration with the metal. The resulting "true" topographic corrugation of G-the difference in height among the topmost and the bottom C atom-varies widely, even in the weakly interacting cases, where it ranges from ≈50 pm on Ir [23,24] to practically flat (≤ 3 pm) on Pt [21].While STM can easily resolve these moiré patterns, even in the G=Pt case [21,25], AFM experiments have only been reported in highly corrugated cases as Ru [26], Rh [27], and Ir [12,28]. Focusing on the most challenging case, G=Ir, experiments with a Kolibri sensor using a W tip clearly resolved the moiré in constant height (CH) AFM images [28]. Measurements with a tuning fork using both inert (CO-terminated) and reactive (Ir-terminated) tips [12] were able to identify the atoms with both tips at any tip-sample distance. This atomic-scale resolution allowed the ...

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Atomic-Resolution Dynamic Force Microscopy and Spectroscopy of a Single-Walled Carbon Nanotube: Characterization of Interatomic van der Waals Forces

Cited by 89 publications

References 25 publications

A review on the role of interface in mechanical, thermal, and electrical properties of polymer composites

A review on the role of interface in mechanical, thermal, and electrical properties of polymer composites

Understanding image contrast formation in TiO2with force spectroscopy

Atomic-Scale Variations of the Mechanical Response of 2D Materials Detected by Noncontact Atomic Force Microscopy

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