Atomic motion of resonantly vibrating quartz crystal visualized by time-resolved X-ray diffraction

Abstract

Transient atomic displacements during a resonant thickness-shear vibration of AT-cut α-quartz are revealed by time-resolved X-ray diffraction under an alternating electric field. The lattice strain resonantly amplified by the alternating electric field is ∼104 times larger than that induced by a static electric field. The resonantly amplified lattice strain is achieved by fast displacements of oxygen anions and collateral resilient deformation of Si−O−Si angles bridging rigid SiO4 tetrahedra, which efficiently transduce electric energy into elastic energy.

Transient Crystal Structure of Oscillating Quartz

“…In order to measure small atomic displacements in piezoelectric crystals under an electric field, the authors have developed a new method for structure analysis of piezoelectric crystals that utilizes resonance under an alternating electric field [1]. Piezoelectric crystals vibrate mechanically and electrically at a certain natural frequency when an instantaneous stress or electric field is applied.…”

“…Transient atomic displacements in a quartz oscillator were successfully measured by the SR time-resolved X-ray diffraction under an AC electric field [1]. Quartz crystal belongs to the trigonal crystal system with the point group 32.…”

“…The authors have been investigating the mechanism of piezoelectricity of quartz and other piezoelectric crystals and synthesizing new piezoelectric crystals such as langasite-type crystals to develop crystals with high functional piezoelectricity superior to quartz crystals. In this chapter, we introduce transient crystal structures of quartz and langasite-type crystals oscillating under an alternating electric field measured by synchrotron X-ray diffraction [1][2][3]. Since inverse piezoelectricity is caused by atomic displacements under electric field, measurement of atomic displacements under an electric field is essential to understand the mechanism of piezoelectricity.…”

Scanning time-resolved measurement of transient lattice strain on quartz oscillators resonating under alternating electric field

“…Transient lattice strains during lattice vibration can be measured by time-resolved XRD (TR-XRD). [23][24][25][26][27][28][29][30][31][32] We developed a TR-XRD technique to measure transient lattice strains and atomic displacements in piezoelectric oscillators which were extremely enhanced by their resonant vibrations under an alternating electric field. [27][28][29][30] The TR-XRD technique is applied to the scanning measurement of the transient and local lattice strain on resonating quartz crystals in this study.…”

Time-resolved structure analysis of vibrating gallium phosphate under alternating electric field

“…We have recently succeeded in detecting such small atomic displacements in piezoelectric oscillators of α-quartz (SiO2) and langasitetype crystals (La 3 Ga 5 SiO 14 and Nd 3 Ga 5 SiO 14 ) under alternating electric fields by using a combination of resonant mechanical vibration and time-resolved XRD [1][2][3]. The amplitudes of the mechanical vibration of piezoelectric oscillators under an alternating electric field were resonantly enhanced at the fundamental resonant frequency.…”