2014
DOI: 10.1016/j.susc.2013.10.022
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Atomic layering and misfit-induced densification at the Si(111)/In solid–liquid interface

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Cited by 9 publications
(12 citation statements)
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“…Thermal vibration can explain this, since its squared amplitude scales linearly with the temperature to first order in the harmonic approximation [26]. The correlation length of approximately 20 Å near room temperature has also been found for other solid-liquid metal-semiconductor interfaces [25,27,28]. The linear decrease of the correlation with an increasing temperature has been observed for room-temperature ionic liquids (RTILs) in contact with a hard wall as well [29].…”
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confidence: 72%
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“…Thermal vibration can explain this, since its squared amplitude scales linearly with the temperature to first order in the harmonic approximation [26]. The correlation length of approximately 20 Å near room temperature has also been found for other solid-liquid metal-semiconductor interfaces [25,27,28]. The linear decrease of the correlation with an increasing temperature has been observed for room-temperature ionic liquids (RTILs) in contact with a hard wall as well [29].…”
mentioning
confidence: 72%
“…At the very interface, i.e., the last crystal layer (Ga0) and the first quasiliquid transition layer (Ga1), we find an appreciable number of atomic vacancies, which lead to a density deficit compared to a bulk terminated situation. Indications of atomic vacancies in the two layers adjacent to the solid-liquid interface have been observed before [18,25,34], but the quality of the interface and/or x-ray scattering power of the systems in those studies did not allow for any solid conclusions to be drawn. In the present case, the high quality of the system gives a high confidence in the presence of these defects.…”
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confidence: 95%
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“…The inconsistency in the atomic arrangement at this interface has not been clearly explained because of the difficulty in the atomic-scale characterisation of the S/L interface both theoretically and experimentally. As an interface-sensitive, angstrom-scale resolution surface X-ray diffraction (SXRD) and X-ray crystal truncation rod (CTR) analysis has provided new insights into atomic arrangements at surfaces and interfaces 6,[25][26][27][28][29][30][31][32][33] . Compared with HRTEM, the CTR technique is a spatially averaged (~0.2 × 0.25 mm 2 in our experiment) method that can also easily distinguish the atomic species 34 .…”
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confidence: 99%
“…Indeed, already deposition of the order of 1 ML of Ga or As on AlGaAs changes the surface reconstructions [53], for which dangling bonds and strain play a big role. There are also reports for the Si(111) surface, buried under liquid indium [54] or lead [55], which do not observe a reconstructed surface at the interface. These examples are important when discussing the stability of surfaces in contact with liquids and illustrate why in first-order approximation we do not assume high-index facets to have formed.…”
Section: Discussionmentioning
confidence: 90%