2013
DOI: 10.1002/cvde.201207026
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Atomic Layer Deposition of LiF Thin Films from Lithd and TiF4 Precursors

Abstract: ithium fluoride (LiF) is an important optical material with a low refractive index and a large band gap. In this study, thin films of LiF are deposited using atomic layer deposition (ALD). Lithd and TiF 4 are used as precursors, and they produce crystalline LiF in the temperature range 250-350 8C. The films are studied with UV-Vis spectrometry, field emission scanning electron microscopy (FESEM), X-ray diffraction (XRD), atomic force microscopy (AFM) and elastic recoil detection analysis (ERDA).Adhesion of the… Show more

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Cited by 37 publications
(60 citation statements)
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“…Unlike the Lithd + TiF 4 process of ref. [150], this sequence shows both an ALD window between 325 and 350 • C and saturation with respect to both Lithd and TiF 4 ( Figure 14). The growth rate at 325 • C was 1.4 Å/cycle, as opposed to 1.0 Å/cycle in the previous LiF process.…”
Section: Ald Of Metal Fluorides Using Metal Fluorides As the Fluorinementioning
confidence: 94%
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“…Unlike the Lithd + TiF 4 process of ref. [150], this sequence shows both an ALD window between 325 and 350 • C and saturation with respect to both Lithd and TiF 4 ( Figure 14). The growth rate at 325 • C was 1.4 Å/cycle, as opposed to 1.0 Å/cycle in the previous LiF process.…”
Section: Ald Of Metal Fluorides Using Metal Fluorides As the Fluorinementioning
confidence: 94%
“…Using TiF 4 as the fluorine source leads to higher growth rates compared to the use of HF, possibly due to the formation of the fluoride in question during both precursor pulses [155,156]. When using TiF 4 as the fluorine source, the film growth usually shows saturation with respect to the fluorine precursor (Figure 13b) but the metal precursor can show either poor [150,153,157] or good saturation [158], depending on the material deposited (Figure 13a). Pilvi et al postulated that the reason for the non-saturative behaviour might be either slow kinetics or an enhancement of metal precursor decomposition caused by the TiF x -surface groups [153].…”
Section: Ald Of Metal Fluorides Using Metal Fluorides As the Fluorinementioning
confidence: 99%
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