2016
DOI: 10.1016/j.apsusc.2016.04.120
|View full text |Cite
|
Sign up to set email alerts
|

Atomic layer deposition of indium oxide thin film from a liquid indium complex containing 1-dimethylamino-2-methyl-2-propoxy ligands

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

3
12
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 19 publications
(15 citation statements)
references
References 39 publications
3
12
0
Order By: Relevance
“…Figure 5 b shows the In3 d 5/2 peak observed at 444.3, 444.4, 444.1, and 444.1 eV at 115–250 °C, indicating In–O bond. The In3 d 5/2 binding energies valves are close to the reported In 2 O 3 (444.2 eV) [ 23 , 37 ]. Compared to the binding energy of In 2 O 3 film deposited at 150 °C, at high growth temperatures of 200 and 250 °C, the In3 d 5/2 core peak shifted slightly to the lower binding energy of 0.3 eV.…”
Section: Resultssupporting
confidence: 85%
See 2 more Smart Citations
“…Figure 5 b shows the In3 d 5/2 peak observed at 444.3, 444.4, 444.1, and 444.1 eV at 115–250 °C, indicating In–O bond. The In3 d 5/2 binding energies valves are close to the reported In 2 O 3 (444.2 eV) [ 23 , 37 ]. Compared to the binding energy of In 2 O 3 film deposited at 150 °C, at high growth temperatures of 200 and 250 °C, the In3 d 5/2 core peak shifted slightly to the lower binding energy of 0.3 eV.…”
Section: Resultssupporting
confidence: 85%
“…Figure 1 c displays the growth rate of ALD-In 2 O 3 thin films as a function of growth temperature using the optimized pulse conditions. Figure 1 c shows that the growth rate was directly dependent on the deposition temperature, increasing with temperature with no separate temperature window within which a constant growth rate was observed, as reported earlier with other conditions [ 23 , 24 ]. Otherwise, our results are inconsistent with the previous reports; ALD-deposited In 2 O 3 thin film with TMIn with ozone and TEIn with ozone was proposed in ALD process windows between 100 and 200 °C [ 29 , 31 ] and others [ 28 ].…”
Section: Resultssupporting
confidence: 82%
See 1 more Smart Citation
“…An air roughness model consisting of a four-layer structure of “air, air/In 2 O 3 , In 2 O 3 and silicon wafer”, where the In 2 O 3 layer was fitted by a Tauc–Lorentz model was used to fit the data. The light absorption coefficient (α) was calculated from the extinction coefficient using the following equation [ 19 ]: α = 4πk/ λ where is λ the wavelength of the incident light. The optical band gap ( E g ) of the In 2 O 3 films was deduced by fitting the Tauc plot [ 20 ] as expressed by the equation: (αh ν ) 2 = A(h ν − E g ) where α is the light absorption coefficient of the In 2 O 3 film, h ν is the energy of the incident light, A is a constant.…”
Section: Methodsmentioning
confidence: 99%
“…An air roughness model consisting of a four-layer structure of "air, air/In 2 O 3 , In 2 O 3 and silicon wafer", where the In 2 O 3 layer was fitted by a Tauc-Lorentz model was used to fit the data. The light absorption coefficient (α) was calculated from the extinction coefficient using the following equation [19]:…”
Section: Methodsmentioning
confidence: 99%