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2023
DOI: 10.1021/acsami.3c06780
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Atomic Layer Deposition of Defective Amorphous TiOx Thin Films with Improved Photoelectrochemical Performance

Min-Ji Kim,
Jong-Seong Bae,
Myung-Jin Jung
et al.

Abstract: A proper control of defects in TiO2 thin films is challenging work for enhancing the photoelectrochemical (PEC) efficiency in water splitting processes. Additionally, a deep understanding of how defects affect the PEC performance of TiO2 thin films is of great interest for achieving better performance. With these aims, we prepared defective amorphous TiO x thin films at various growth temperatures by atomic layer deposition using tetrakis­(dimethylamido)­titanium as the Ti precursor. Careful X-ray photoelect… Show more

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Cited by 3 publications
(4 citation statements)
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“…A smaller arc radius shows an efficient charge transfer and a more effective separation of photoinduced charge carriers. 47…”
Section: Resultsmentioning
confidence: 99%
“…A smaller arc radius shows an efficient charge transfer and a more effective separation of photoinduced charge carriers. 47…”
Section: Resultsmentioning
confidence: 99%
“…[61] For example, several studies have been published on modifying the bandgap energy of TiO 2 by creating oxygen vacancies, or N-and Hdoping, which enhanced its visible light absorption (Figure 8A,B). [204] Despite the bandgap narrowing of the semiconductors, numerous studies have been published on heteroatom doping to mitigate the inherent limitations such as charge separation and transfer of the semiconductors. In this regard, the PEC performance of porous BiVO 4 photoanode Figure 7.…”
Section: Band Gap and Defect Concentrationmentioning
confidence: 99%
“…[202] All the potential is represented here in RHE (at pH = 0). [204] (Reproduced from reference [204] with permission Copyright 2023, American Chemical Society). (c-e) exhibit the change in bandgap energy upon heteroatom doping in BiVO 4 photoanode [106,107] and (f) shows the improved PEC stability curve by tuning bandgap energy and protective coating on BiVO 4 photoanode.…”
Section: Band Gap and Defect Concentrationmentioning
confidence: 99%
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