“…In this section, we review characterization strategies that researchers have pursued to understand the morphology of thin-film perovskites and how they linked their findings to the obtained properties (Table 5). 15,46,[64][65][66]70,72,[76][77][78][79][80][81]83,[85][86][87]90,94,97,98,102,[104][105][106] To obtain compositional information, XPS is the most common technique. The information that can be obtained ranges from film contamination to the elemental composition within the topmost 1-10 nm of the film and its uniformity, chemical and electronic states, binding information, and depth information.…”