2014
DOI: 10.1088/2053-1591/1/4/046410
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Atomic layer-by-layer deposition of h-BN(0001) on cobalt: a building block for spintronics and graphene electronics

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Cited by 19 publications
(35 citation statements)
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“…This may allow formation of an epitaxial (1 × 1) interface with high structural perfection, similarly to the recently studied graphene/Co(0001) interface [39]. Indeed, several works reported formation of h-BN films of different thickness on the Co(0001) surface and confirmed strict orientation of ultrathin h-BN [40][41][42]. However, the crystal structure of the h-BN monolayer on the Co(0001) surface is yet to be studied.…”
Section: Introductionmentioning
confidence: 57%
“…This may allow formation of an epitaxial (1 × 1) interface with high structural perfection, similarly to the recently studied graphene/Co(0001) interface [39]. Indeed, several works reported formation of h-BN films of different thickness on the Co(0001) surface and confirmed strict orientation of ultrathin h-BN [40][41][42]. However, the crystal structure of the h-BN monolayer on the Co(0001) surface is yet to be studied.…”
Section: Introductionmentioning
confidence: 57%
“…Therefore, bilayer and trilayer h-BN(0001) films are deposited onto Co(0001) without evidence of Co oxidation, promising for applications in spintronics and graphene electronics. 79 Recently, multilayer azimuthally oriented h-BN thin films showing highly ordered large areas and domains (up to 20 µm) are uniformly and continuously deposited on Co(0001) by ALD followed by UHV annealing, as demonstrated by cross-section HRTEM (Figure 3a). 61 Then, graphene is grown on pinhole-free h-BN/Co(0001) using Molecular Beam Epitaxy (MBE) as shown in Figure 3b.…”
Section: Boron Halidementioning
confidence: 99%
“…They deposited the BN films at 277 C and then treated them with post-annealing at 727 C in a vacuum. In addition, Co(0001) (Figure 3D), 61,62 RuO 2 (110), 63 and Ni(111) 66 substrates were also favorable for achieving crystalline h-BN. In all cases, post-treatment higher than 427 C in a vacuum was applied.…”
Section: -Bnhmentioning
confidence: 99%
“…b RT indicates room temperature. c Annealing in a vacuum at 727 C,60 427 C,61,62 and 527 C,63 respectively.d The films grown at 900 C belongs to the precursor-dependent characteristics of CVD growth, instead of ALD growth. e This deposition process applied electron-enhanced atomic layer deposition (EEALD).…”
mentioning
confidence: 99%