Atomic Force Microscopy, Transmission Electron Microscopy, Scanning Electron Microscopy, and FourierTransform‐InfraredSpectroscopic Imaging as Tools to Study Various Phenomena Involving Poly(Vinylpyrrolidone)

Abstract

This chapter examine state‐of‐the‐art advanced imaging techniques and how these tools can be used to study polymer blends and composites containing poly(vinylpyrrolidone) (PVP) and its derivatives. The imaging technologies discussed consist of many of the modes of atomic force microscopy as well as basic and advanced methods in transmission electron microscopy (TEM) and scanning electron microscopy (SEM). There are two principal types of electron microscopy, SEM and TEM. Both techniques provide different types of information about the sample under investigation. The chapter demonstrates the use of Fourier transform–infrared (FT‐IR) spectroscopic imaging to spatially map elements of multicomponent systems. FT‐IR spectroscopic imaging is a technique that involves the coupling of an FT‐IR spectrometer with an optical microscope. Powerful tool based on AFM and IR spectroscopy has become available to researchers. The chapter also demonstrates the use of imaging technologies to characterize PVP‐metal nanoparticle composites with a specific focus on silver and gold particles.