Atomic Force Microscopy Study of Conductive Polymers

Qualitative Nanocharacterization of Silver Structures Synthesized from the Reduction of Complex Ions in Polymer Templates: An Inquiry-Based Introduction to Conductive Atomic Force Microscopy

“…Samples are mounted on a piezoelectric tube that allows precise scanning with subnanometer resolution. 5 To form an image, the tip is brought into contact with or close to the sample surface and scanned causing the cantilever to deflect in response to changes in surface heights. This action results in the formation of a line-by-line image of sample topography.…”

“…5 The cantilever bends vertically upward or downward due to repulsive or attractive tip/sample interactions. 5 The CAFM setup (Figure 1) is similar to the standard AFM; there are three main differences: (1) the probe tip must be conductive, (2) voltage is applied to the tip and the sample, and (3) a preamplifier is required to convert the measured currents into signals read by a computer. 4 The most common practice regarding CAFM sample preparation involves the of use silver paint to fix the sample to the imaging disk.…”

“…Standard AFM systems characterize nanoscale features by scanning over sample surfaces with a sharp tip situated at the end of a flexible cantilever composed of silicon or silicon nitride. Samples are mounted on a piezoelectric tube that allows precise scanning with subnanometer resolution . To form an image, the tip is brought into contact with or close to the sample surface and scanned causing the cantilever to deflect in response to changes in surface heights.…”

“…This action results in the formation of a line-by-line image of sample topography. An optical lever consisting of a laser light reflected off the back surface of the cantilever onto a position-sensitive photodetector is used to detect cantilever deflection . The cantilever bends vertically upward or downward due to repulsive or attractive tip/sample interactions .…”

“…An optical lever consisting of a laser light reflected off the back surface of the cantilever onto a position-sensitive photodetector is used to detect cantilever deflection . The cantilever bends vertically upward or downward due to repulsive or attractive tip/sample interactions . The CAFM setup (Figure ) is similar to the standard AFM; there are three main differences: (1) the probe tip must be conductive, (2) voltage is applied to the tip and the sample, and (3) a preamplifier is required to convert the measured currents into signals read by a computer .…”