Abstract:The morphological and conductive structure of surface and bulk of different ionomer, namely Nafion®, Aquivion®, and JST have been investigated by material-sensitive and conductive tapping mode atomic force microscopy (AFM). The thickness of the non-conducting surface skin layer could be measured directly. The ionic structure at equilibrium was found to be consistent with the 4 nm size of the "ionic peak" in SAXS. At freshly cut cross sections of Nafion® defined ionic regions with low adhesion and a high adhesi… Show more
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