2016
DOI: 10.1134/s106378421607015x
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Atomic-force microscopy of submicron films of electroactive polymer

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Cited by 7 publications
(7 citation statements)
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“…In the entire thickness range from 3 nm to 1 µm, the films are solid, without significant defects and/or pin holes. The polymer films were studied by atomic force microscopy (AFM) using earlier described methodology [5]. The study of the film morphology showed that they are homogeneous, and within the entire thickness range from 3 nm to 1 µm the films are solid, without significant defects and/or pin holes.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…In the entire thickness range from 3 nm to 1 µm, the films are solid, without significant defects and/or pin holes. The polymer films were studied by atomic force microscopy (AFM) using earlier described methodology [5]. The study of the film morphology showed that they are homogeneous, and within the entire thickness range from 3 nm to 1 µm the films are solid, without significant defects and/or pin holes.…”
Section: Methodsmentioning
confidence: 99%
“…1a. Polymers of this class are soluble in organic solvents and have exceptional film-forming properties [5,6].…”
Section: Introductionmentioning
confidence: 99%
“…In the entire thickness range from 3 nm to 1 µm, the films are solid, without significant defects and/or pin holes. The polymer films were studied by atomic force microscopy (AFM) using an earlier described methodology [ 5 ]. The study of the film morphology showed that they are homogeneous, and within the entire thickness range from 3 nm to 1 µm the films are solid, without significant defects and/or pin holes.…”
Section: Methodsmentioning
confidence: 99%
“…A model image of the structural unit of the PDP polymer is shown in Figure 1a . Polymers of this class are soluble in organic solvents and have exceptional film-forming properties [ 5 6 ]. According to these results, continuous homogeneous films can be obtained by centrifugation from a solution in cyclohexanone on a metal surface with a thickness from several nanometers up to micrometers.…”
Section: Introductionmentioning
confidence: 99%
“…For research using AFM method the polymer films of polydiphenylenephthalide (PDP) on polished substrates of stainless steel were manufactured using procedure described in [12]. Films thickness was set by polymer concentration in a solventcyclohexanone.…”
Section: Methodsmentioning
confidence: 99%