Atomic force microscopic observation at initial growth stage of vacuum-deposited thin film of polyvinylidenefluoride

Abstract

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Estimating the thickness of hydrated ultrathin poly(o-phenylenediamine) film by atomic force microscopy

“…AFM measurements can be made both in air and in liquid, its images are high resolution, and complex sample pretreatments are unnecessary. Because of these attributes and because it can easily be performed in liquid and directly measure height difference, AFM has been widely used to measure the morphology of biological samples [26,27] and polymers [28][29][30][31][32] as well as to estimate the elasticity of soft samples [33][34][35]. For instance, the nanometer level of thickness of highly oriented poly(tetrafluoroethylene) thin film varying from 7 to 32 nm can be easily determined by AFM topography in air [36].…”