1999
DOI: 10.1016/s0169-4332(98)00601-1
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Atomic force microscope study of carbon thin films prepared by pulsed laser deposition

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Cited by 42 publications
(4 citation statements)
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“…6,[19][20][21][22] To prepare ultrathin ͑2-3 nm͒ DLC films for magnetic storage applications, surface roughness at an atomic level is required. 6,[19][20][21][22] To prepare ultrathin ͑2-3 nm͒ DLC films for magnetic storage applications, surface roughness at an atomic level is required.…”
Section: Introductionmentioning
confidence: 99%
“…6,[19][20][21][22] To prepare ultrathin ͑2-3 nm͒ DLC films for magnetic storage applications, surface roughness at an atomic level is required. 6,[19][20][21][22] To prepare ultrathin ͑2-3 nm͒ DLC films for magnetic storage applications, surface roughness at an atomic level is required.…”
Section: Introductionmentioning
confidence: 99%
“…One of the major field of study is directed toward synthesizing new thin films by pulsed laser deposition technique. [3,6] Pulse laser causes the instantaneous explosion on the target material surface to form a plasma and molecular cloud called plume. Absorption of laser energy and the successive energy conversion process, particle evaporation process, their interaction, evolution of the heated target surface are closely connected with each other, and the senario to explian the whole phenomena is still far from completed.…”
Section: Introductionmentioning
confidence: 99%
“…8,9) This method is appropriate for fabricating multilayered film because of the following points: (i) congruent transfer between the target and the deposited film; (ii) low-temperature growth compared with other methods; and (iii) delicate control of the film thickness due to the pulsed deposition.…”
mentioning
confidence: 99%