Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes

Riggins, Ti'Air E; Li, Wen; Purcell, Erin K.

doi:10.1109/embc48229.2022.9871216

2022 44th Annual International Conference of the IEEE Engineering in Medicine &Amp; Biology Society (EMBC) 2022

DOI: 10.1109/embc48229.2022.9871216

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Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes

Ti'Air E Riggins

Wen Li

Erin K. Purcell

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Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes

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References 27 publications

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