Atomic Force and Ultrasonic Force Microscopy Investigation of Adsorbed Layers Formed by Two Incompatible Polymers: Polystyrene and Poly(butyl methacrylate)

Vn, Bliznyuk; Lipatov, Yu.S.; Özdemir, Nurten; Tt, Todosijchuk; Vn, Chornaya; Singamaneni, Srikanth

doi:10.1021/la701644n

Cited by 8 publications

(2 citation statements)

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“…Moreover, the UFM signal from the lock-in amplifier can be mapped at each point of the scanned area, thus obtaining images reflecting the elastic properties of sample surface. UFM has been used for the characterization of different polymeric samples, such as biphasic polymer blends, polymeric matrices incorporating either rubber nanoparticles or glass fibers, polymeric nanobundles, and hydrogels [93,[95][96][97][98][99][100]. The quantitative determination of surface viscoelastic parameters is more difficult than in CR-AFM owing to the lack of complete analytical models.…”

Section: Ultrasonic Force Microscopymentioning

confidence: 99%

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

et al. 2012

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Polymeric thin films have been awakening continuous and growing interest for application in nanotechnology. For such applications, the assessment of their (nano)mechanical properties is a key issue, since they may dramatically vary between the bulk and the thin film state, even for the same polymer. Therefore, techniques are required for the in situ characterization of mechanical properties of thin films that must be nondestructive or only minimally destructive. Also, they must also be able to probe nanometer-thick ultrathin films and layers and capable of imaging the mechanical properties of the sample with nanometer lateral resolution, since, for instance, at these scales blends or copolymers are not uniform, their phases being separated. Atomic force microscopy (AFM) has been proposed as a tool for the development of a number of techniques that match such requirements. In this review, we describe the state of the art of the main AFM-based methods for qualitative and quantitative single-point measurements and imaging of mechanical properties of polymeric thin films, illustrating their specific merits and limitations.

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Section: Ultrasonic Force Microscopymentioning

confidence: 99%

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

et al. 2012

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“…Ultrasonic Force Microscopy (UFM) is a powerful technique to investigate the elastic and adhesive response of materials on the nanoscale [1,2]. The procedure is capable to provide material contrast in both soft and hard samples, bringing additional advantages when compared with other Scanning Probe Microscopy (SPM) approaches [3][4][5][6]. Here, UFM is applied to the characterization of composite samples formed by SrTiO3 (STO) nanoparticles (NP) and poly(vinyl alcohol) (PVA).…”

Section: -Introductionmentioning

confidence: 99%

Ultrasonic force microscopy on poly(vinyl alcohol)/SrTiO3 nano-perovskites hybrid films

et al. 2014

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Atomic Force Microscopy (AFM) and Ultrasonic Force Microscopy (UFM) have been applied to the characterization of composite samples formed by SrTiO3 (STO) nanoparticles (NPs) and polyvinyl alcohol (PVA). The morphological features of the STO NPs were much better resolved in UFM than in contact-mode AFM topography. For high STO concentrations the individual STO NPs formed nanoclusters, which gathered in microaggregates. The STO aggregates, covered by PVA, exhibited no AFM frictional contrast, but were clearly distinguished from the PVA matrix using UFM. Similar aggregation was observed for NPs in the composite samples than for NPs deposited on top of a flat silicon substrate from a milliQ water solution in the absence of polymer. In the hybrid films, most STO nanoparticles typically presented a lower UFM contrast than the PVA matrix, even though stiffer sample regions such as STO should give rise to a higher UFM contrast. STO NPs with intermediate contrast were characterized by an UFM halo of lower contrast at the PVA/STO interface. The results may be explained by considering that ultrasound is effectively damped on the nanometer scale at PVA/ STO interfaces. According to our data, the nanoscale ultrasonic response at the PVA/STO interface plays a fundamental role in the UFM image contrast.KEYWORDS. Atomic Force Microscopy. Ultrasonic Force Microscopy. Poly(vinyl alcohol). Stroncium Titanate. Nanoparticles. Nanocomposites. 1-IntroductionUltrasonic Force Microscopy (UFM) is a powerful technique to investigate the elastic and adhesive response of materials on the nanoscale [1,2]. The procedure is capable to provide material contrast in both soft and hard samples, bringing additional advantages when compared with other Scanning Probe Microscopy (SPM) approaches [3][4][5][6]. Here, UFM is applied to the characterization of composite samples formed by SrTiO3 (STO) nanoparticles (NP) and poly(vinyl alcohol) (PVA). We intend to further explore the capability of the technique to provide subsurface information, to characterize the nanostructures formed by STO NP in the PVA hybrid films, and to gain inside into the mechanisms of ultrasound propagation on the nanoscale and the origin of the UFM contrast.The insertion of ceramics nanoparticles into polymer matrix has led to the generation of novel hybrid materials with improved electrical and thermo-mechanical properties. In titanate-polymer composites, the titanates contribute with a high capacitance, and the polymers are typically easy to process. Hence, the composite films appear very attractive for the fabrication of integrated circuits [7,8]. Composites of STO with polymeric materials have been considered for microwave applications [9,10]. The dielectric properties of PVA mixed with PbTiO3 show promise for their application as supercapacitors and humidity sensors [11]. STO nanoparticles are being tested for the development of thin film transistors [8], batteries [12], photodiodes [13], and solar cells [14]. Also, they may exhibit photocatalytic activity [15][16...

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Multicomponent Polymer Systems and Fibers

Tsukruk

Singamaneni

2011

Scanning Probe Microscopy of Soft Matter

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Atomic Force and Ultrasonic Force Microscopy Investigation of Adsorbed Layers Formed by Two Incompatible Polymers: Polystyrene and Poly(butyl methacrylate)

Cited by 8 publications

References 49 publications

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

Ultrasonic force microscopy on poly(vinyl alcohol)/SrTiO3 nano-perovskites hybrid films

Multicomponent Polymer Systems and Fibers

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