Atomic Force and Ultrasonic Force Microscopic Investigation of Laser‐Treated Ceramic Head Sliders

Druffner, Carl J.; Sathish, Shamachary

doi:10.1111/j.1151-2916.2003.tb03619.x

Cited by 8 publications

(5 citation statements)

References 28 publications

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“…But bear in mind that the above discussions are presented to review all the known complications, whereas actual experimental results will often be sensitive primarily to far fewer (and controllable) details. Accordingly, a wide range of UFM measurements has been reported on polymers (16)(17)(18), metals (19,20), semiconductors (21-23), ceramics (24)(25)(26)(27), and a variety of nanomaterials (1,(28)(29)(30). Quantitatively, these studies are generally based on analyzing individual UFM spectra (especially the JOA i and/or the hysteresis area) or differential UFM measurements (essentially comparing JOA i for different setpoint forces).…”

Section: Ultrasonic Amplitude (å) Ufm Deflection (å)mentioning

confidence: 99%

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

Huey

2007

Annu. Rev. Mater. Res.

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Combining atomic force microscopy and ultrasonic methods allows near-field detection of acoustic signals and thereby otherwise inaccessible nanoscale mechanical characterization. The two predominant variations, ultrasonic force microscopy and atomic force acoustic microscopy, are reviewed in detail. Applications of each to ceramics, polymers, metals, biological materials, and even subsurface structures are discussed, with a particular emphasis on image contrast mechanisms, data analysis, and experimental challenges. Finally, recent advances of these concepts into high-speed surface property mapping are presented, demonstrating 100-fold enhancements in full-frame imaging speeds.

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Section: Ultrasonic Amplitude (å) Ufm Deflection (å)mentioning

confidence: 99%

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

Huey

2007

Annu. Rev. Mater. Res.

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“…It has been found that in many materials, even if contrast is poor in AFM images, the elastic property variations imaged in UFM enhances the contrast [14], [15]. This particularly becomes useful when the surface topography variations imaged in AFM is extremely low.…”

Section: Introductionmentioning

confidence: 95%

Use of Ultrasonic Force Microscopy to Image the Interior Nanoparticles in ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7-{\rm x}}$ Films

Varanasi

Nalladega

Sathish

et al. 2007

IEEE Trans. Appl. Supercond.

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Nanoparticles present in the interior of YBa 2 Cu 3 O 7 x (YBCO) films were successfully imaged for the first time by using an ultrasonic force microscope (UFM), which can also operate as a conventional atomic force microscope (AFM).Nanoparticles of Y 2 BaCuO 5 and BaSnO 3 were introduced into YBCO films using pulsed laser ablation to improve critical current density via enhanced flux pinning. The scanning speed and ultrasonic frequencies in the range of 300-500 kHz were optimized for each sample such that the nanometer sized particles on the surface as well as from the film interior can be imaged with good contrast and resolution. UFM and AFM scans taken of the same locations were compared to show the advantages of using UFM over AFM. We demonstrate that UFM can be used nondestructively to both characterize the interior nanoparticles introduced in YBCO films and provide high resolution images of the screw dislocation induced terraces present in the films.

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“…The approach used in the present investigation has been described in detail in a previous study 26 . In brief, a piezo-electric transducer was attached to one face of the sample, and excited with a low amplitude continuous wave radio frequency signal in the range of 0.5 to 1.0 MHz.…”

Section: Afm-ufmmentioning

confidence: 99%

Characterization of Carbon Nanofibre Reinforced Epoxy Composite using Nanoindentation and AFM/UFM Techniques

Lee

Mall

Nalladega

et al. 2006

Polymers and Polymer Composites

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Carbon nanofibre (CNF) reinforced epoxy composites were characterized using nanoindentation, Atomic Force Microscopy (AFM) and Ultrasonic Force Microscopy (UFM). These tests were supplemented with ultrasonic wave propagation and three-point bend test methods. CNFs were functionalised with oxygen to improve dispersion and adhesion in the epoxy matrix. The CNF/epoxy composites showed an improvement in modulus and hardness compared to those of neat epoxy resin. The improvement was dependent on the functionalisation treatment time; however, the increase was of a different magnitude when measured by three methods: nanoindentation, wave propagation method and three-point bend (TPB) test. Thus, the indention test technique is capable of providing mechanical properties from a limited size and/or quantity of nanocomposites, which is generally the case during the initial material development stage. Further, the AFM-UFM was able to characterize the dispersion behavior of CNFs in nanocomposites, which is an important factor to improve the mechanical properties of nanocomposites. However, UFM provided much clearer information about dispersion than AFM. Finally, AFM-UFM appears to be a promising technique for observing nanocomposites at nanoscale and it has potential for the mapping of the local surface stiffness at nanoscale.

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Atomic Force and Ultrasonic Force Microscopic Investigation of Laser‐Treated Ceramic Head Sliders

Cited by 8 publications

References 28 publications

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

Use of Ultrasonic Force Microscopy to Image the Interior Nanoparticles in ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7-{\rm x}}$ Films

Characterization of Carbon Nanofibre Reinforced Epoxy Composite using Nanoindentation and AFM/UFM Techniques

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